Search Results - "Stack DM"

The Caring Intensively Study: Three-Year Follow-Up Findings From a Mixed Methods Study of Children's Psychological and Behavioral Responses After PICU Hospitalization.

Authors: Rennick JE Dougherty G Dryden-Palmer K et al.

Source: Pediatric critical care medicine : a journal of the Society of Critical Care Medicine and the World Federation of Pediatric Intensive and Critical Care Societies [Pediatr Crit Care Med] 2025 Apr 01; Vol. 26 (4), pp. e516-e530. Date of Electronic Publication: 2025 Feb 14.

Publication Type: Journal Article; Multicenter Study

Journal Info: Publisher: Lippincott Williams & Wilkins Country of Publication: United States NLM ID: 100954653 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1529-7535 (Print) Linking ISSN: 15297535 NLM ISO Abbreviation: Pediatr Crit Care Med Subsets: MEDLINE

Emotional competence and help-seeking intentions as predictors of educational success in vocational training students.

Authors: Gilbert W Stack DM Barker ET et al.

Source: Journal of adult and continuing education [J Adult Contin Educ] 2024 Jul 24; Vol. 30 (2), pp. 617-639. Date of Electronic Publication: 2024 Jul 24 (Print Publication: 2024).

Publication Type: Journal Article

Journal Info: Country of Publication: England NLM ID: 9919257113406676 Publication Model: eCollection Cited Medium: Internet ISSN: 1479-7194 (Electronic) Linking ISSN: 14779714 NLM ISO Abbreviation: J Adult Contin Educ Subsets: PubMed not MEDLINE

Temperature sensitive analytical analysis of gate‐stack dual metal nanowire field‐effect transistor (4H‐SiC).

Authors: Neeraj Sharma, Shobha Goel, Anubha et al.

Source: International Journal of Numerical Modelling; Jul2023, Vol. 36 Issue 4, p1-15, 15p

Relationship Quality and Mental Health Implications for Adolescents during the COVID-19 Pandemic: a Longitudinal Study.

Authors: Afriat M De France K Stack DM et al.

Source: Journal of child and family studies [J Child Fam Stud] 2023; Vol. 32 (2), pp. 544-554. Date of Electronic Publication: 2023 Jan 21.

Publication Type: Journal Article

Journal Info: Publisher: Springer Science + Business Media Country of Publication: United States NLM ID: 9214438 Publication Model: Print-Electronic Cited Medium: Print ISSN: 1062-1024 (Print) Linking ISSN: 10621024 NLM ISO Abbreviation: J Child Fam Stud Subsets: PubMed not MEDLINE

Conflict Resolution and Emotional Expression in Sibling and Mother-Adolescent Dyads: Within-Family and Across-Context Similarities.

Authors: Ferrar SJ Stack DM Baldassarre KS et al.

Source: The Journal of early adolescence [J Early Adolesc] 2022 Feb; Vol. 42 (2), pp. 227-261. Date of Electronic Publication: 2021 Jun 01.

Publication Type: Journal Article

Journal Info: Publisher: Sage Publications Country of Publication: United States NLM ID: 8208289 Publication Model: Print-Electronic Cited Medium: Print ISSN: 0272-4316 (Print) Linking ISSN: 02724316 NLM ISO Abbreviation: J Early Adolesc Subsets: PubMed not MEDLINE

Family Members' Perceptions of Their Psychological Responses One Year Following Pediatric Intensive Care Unit (PICU) Hospitalization: Qualitative Findings From the Caring Intensively Study.

Authors: Rennick JE Knox AM Treherne SC et al.

Source: Frontiers in pediatrics [Front Pediatr] 2021 Sep 07; Vol. 9, pp. 724155. Date of Electronic Publication: 2021 Sep 07 (Print Publication: 2021).

Publication Type: Journal Article

Journal Info: Publisher: Frontiers Media SA Country of Publication: Switzerland NLM ID: 101615492 Publication Model: eCollection Cited Medium: Print ISSN: 2296-2360 (Print) Linking ISSN: 22962360 NLM ISO Abbreviation: Front Pediatr Subsets: PubMed not MEDLINE

SiC‐based analytical model for gate‐stack dual metal nanowire FET with enhanced analog performance.

Authors: Neeraj Goel, Anubha Sharma, Shobha et al.

Source: International Journal of Numerical Modelling; Jul2022, Vol. 35 Issue 4, p1-15, 15p

Improved analog and AC performance for high frequency linearity based applications using gate-stack dual metal (DM) nanowire (NW) FET (4H-SiC).

Authors: Neeraj, Neeraj Sharma, Shobha Goel, Anubha et al.

Source: Microsystem Technologies; Oct2023, Vol. 29 Issue 10, p1403-1416, 14p

Baryonic post-processing of N-body simulations, with application to fast radio bursts.

Authors: Williams, Ian M Khan, Adnan McQuinn, Matthew

Source: Monthly Notices of the Royal Astronomical Society; 4/15/2023, Vol. 520 Issue 3, p3626-3640, 15p