Search Results - "Azar M"

Addressing water scarcity to support climate resilience and human health.

Authors: Zimmermann, Karl Abadi, Azar M Brauman, Kate A et al.

Source: Integrated Environmental Assessment & Management. Mar2025, Vol. 21 Issue 2, p291-300. 10p.

Inverterbrate Images: Poet Ethel Barja Cuyutupa (Peru).

Authors: Azar, M. Cecilia¹ mcazar@brown.edu

Source: Middle Atlantic Review of Latin American Studies. 2023, Vol. 7 Issue 2, p197-221. 25p.

Real-time imaging of semiconductor space-charge regions using high-spatial resolution evanescent microwave microscope.

Authors: Tabib-Azar, M. Akinwande, D.

Source: Review of Scientific Instruments; March 2000, Vol. 71 Issue 3, p1460-1465, 6p

Novel hydrogen sensors using evanescent microwave probes.

Authors: Tabib-Azar, M. Sutapun, B.

Source: Review of Scientific Instruments; September 1999, Vol. 70 Issue 9, p3707-3713, 7p

Transient thermography using evanescent microwave microscope.

Authors: Tabib-Azar, M. Ciocan, R. Ponchak, G.

Source: Review of Scientific Instruments; August 1999, Vol. 70 Issue 8, p3387-3390, 4p

Evanescent microwave probes on high-resistivity silicon and its application in characterization of semiconductors.

Authors: Tabib-Azar, M. Akinwande, D. Ponchak, G. E.

Source: Review of Scientific Instruments; July 1999, Vol. 70 Issue 7, p3083-3086, 4p

Nondestructive superresolution imaging of defects and nonuniformities in metals, semiconductors, dielectrics, composites, and plants using evanescent microwaves.

Authors: Tabib-Azar, M. Pathak, P. S. Ponchak, G.

Source: Review of Scientific Instruments; June 1999, Vol. 70 Issue 6, p2783-2792, 10p

0.4 μm spatial resolution with 1 GHz (λ=30 cm) evanescent microwave probe.

Authors: Tabib-Azar, M. Su, D.-P. Pohar, A.

Source: Review of Scientific Instruments; March 1999, Vol. 70 Issue 3, p1725-1729, 5p

Resonance enhancement of optoacoustic signal for frequency stabilization of CO2 laser pump for CH3OH FIR laser.

Authors: Fishback, J. R. Azar, M. Ventrice, C. a

Source: Review of Scientific Instruments; February 1988, Vol. 59, p238-241, 4p

Achieving robust acoustic emission-based damage characterization of scaled laminated composites under indentation.

Authors: Fotouhi, S. Azar, M. R. Khoshravan Fotouhi, M.

Source: Express Polymer Letters. Sep2021, Vol. 15 Issue 9, p839-852. 14p.

Climate regionalization in Bolivia: A combination of non‐hierarchical and consensus clustering analyses based on precipitation and temperature.

Authors: Abadi, Azar M. Rowe, Clinton M. Andrade, Marcos

Source: International Journal of Climatology. Aug2020, Vol. 40 Issue 10, p4408-4421. 14p.

Development of a Submonthly Temperature Product to Monitor Near-Real-Time Climate Conditions and Assess Long-Term Heat Events in the United States.

Authors: RENNIE, JARED BELL, JESSE E. KUNKEL, KENNETH E. et al.

Source: Journal of Applied Meteorology & Climatology; Dec2019, Vol. 58 Issue 12, p2653-2674, 22p

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Self-Oscillating Evanescent Microwave Probes for Nondestructive Evaluations of Materials.

Authors: Tabib-Azar, M. Zhang, Tao LeClair, S. R.

Source: IEEE Transactions on Instrumentation & Measurement; October 2002, Vol. 51 Issue 5, p1126-1132, 7p

Evaluation of GCMs historical simulations of monthly and seasonal climatology over Bolivia.

Authors: Abadi, Azar M. Oglesby, Robert Rowe, Clinton et al.

Source: Climate Dynamics. Jul2018, Vol. 51 Issue 1/2, p733-754. 22p.

Mapping of crystal defects and the minority carrier diffusion length in 6H-SiC using a novel electron beam induced current technique.

Authors: Tabib-Azar, M. Hubbard, S. M. Schnabel, C. M.

Source: Journal of Applied Physics; October 1 1998, Vol. 84 Issue 7, p3986-3992, 7p

A relationship between interface trap density and transconductance in 6H-SiC enhancement mode field-effect transistors.

Authors: Dryfuse, M. W. Tabib-Azar, M.

Source: Solid-State Electronics; September 1996, Vol. 39, p1331-1335, 5p

Applications of an ultra high resolution evanescent microwave imaging probe in the nondestructive testing of materials.

Authors: Tabib-Azar, M.

Source: Materials Evaluation; January 2001, Vol. 59 Issue 1, p70-78, 9p

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