Search Results - "Botman, Aurelien"

Deposition of Highly Porous Nanocrystalline Platinum on Functionalized Substrates Through Fluorine-Induced Decomposition of Pt(PF3)4 Adsorbates.

Authors: Randolph, Steven J. Botman, Aurelien Toth, Milos

Source: Particle & Particle Systems Characterization. Aug2013, Vol. 30 Issue 8, p672-677. 6p.

In situ femtosecond pulse laser ablation for large volume 3D analysis in scanning electron microscope systems.

Authors: Randolph, Steven Jeffrey Filevich, Jorge Botman, Aurelien et al.

Source: Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics; Nov2018, Vol. 36 Issue 6, pN.PAG-N.PAG, 7p

Focused Electron-Beam-Induced Deposition of 3 nm Dots in a Scanning Electron Microscope.

Authors: van Kouwen, Leon Botman, Aurelien Hagen, Cornelis W.

Source: Nano Letters. May2009, Vol. 9 Issue 5, p2149-2152. 4p.

Subjects: Electron beams, Microfabrication, Scanning electron microscopes, Quantum dots, Micrometers

Spontaneous Growth of Gallium-Filled Microcapillaries on Ion-Bombarded GaN.

Authors: Botman, Aurelien Bahm, Alan Randolph, Steven et al.

Source: Physical Review Letters. 9/27/2013, Vol. 111 Issue 13, p135503-1-135503-5. 5p.

Cryo-EM of soft-landed β-galactosidase: Gas-phase and native structures are remarkably similar.

Authors: Esser, Tim K. Böhning, Jan Önür, Alpcan et al.

Source: Science Advances. 2/16/2024, Vol. 10 Issue 7, p1-9. 9p.

Maskless milling of diamond by a focused oxygen ion beam.

Authors: Martin, Aiden A. Randolph, Steven Botman, Aurelien et al.

Source: Scientific Reports. 3/13/2015, p8958. 1p.

Critical Assessment of a Novel Vitrification Platform with Enhanced Robustness Using a Grid Quality Framework with AI-based Image Scoring.

Authors: Konijnenberg, Albert Dijkman, Patricia Wang, Xue et al.

Source: Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 2025 Supplement; Vol. 31.

Journal Info: Publisher: Oxford University Press / USA ISSN: 1431-9276

Merging Machine Learning and TriBeam Tomography for 3D Defect Detection in an AM CoNi-Based Superalloy.

Authors: Lamb, James Echlin, McLean Polonsky, Andrew et al.

Source: Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 2022 Supplement; Vol. 28.

Journal Info: Publisher: Oxford University Press / USA ISSN: 1431-9276

TriBeam Tomography for 3D Data Acquisition.

Authors: Echlin, McLean Polonsky, Andrew Francis, Toby et al.

Source: Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 2020Supplement2; Vol. 26 (S2).

Journal Info: Publisher: Oxford University Press / USA ISSN: 1431-9276

3D Characterization of a Novel CoNi-superalloy for Additive Manufacturing.

Authors: Polonsky, Andrew Francis, Toby Pusch, Kira et al.

Source: Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 2020Supplement2; Vol. 26 (S2).

Journal Info: Publisher: Oxford University Press / USA ISSN: 1431-9276

Liquid phase electron-beam-induced deposition on bulk substrates using environmental scanning electron microscopy.

Authors: Bresin M Botman A Randolph SJ et al.

Source: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2014 Apr; Vol. 20 (2), pp. 376-84. Date of Electronic Publication: 2014 Mar 03.

Publication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S.

Journal Info: Publisher: Oxford University Press Country of Publication: England NLM ID: 9712707 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1435-8115 (Electronic) Linking ISSN: 14319276 NLM ISO Abbreviation: Microsc Microanal Subsets: PubMed not MEDLINE