Search Results - "Botman, Aurelien"

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  1. 1

    In situ femtosecond pulse laser ablation for large volume 3D analysis in scanning electron microscope systems.

    Authors: Randolph, Steven Jeffrey Filevich, Jorge Botman, Aurelien et al.

    Source: Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics; Nov2018, Vol. 36 Issue 6, pN.PAG-N.PAG, 7p

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  2. 2

    Deposition of Highly Porous Nanocrystalline Platinum on Functionalized Substrates Through Fluorine-Induced Decomposition of Pt(PF3)4 Adsorbates.

    Authors: Randolph, Steven J. Botman, Aurelien Toth, Milos

    Source: Particle & Particle Systems Characterization. Aug2013, Vol. 30 Issue 8, p672-677. 6p.

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  3. 3

    Critical Assessment of a Novel Vitrification Platform with Enhanced Robustness Using a Grid Quality Framework with AI-based Image Scoring.

    Authors: Konijnenberg, Albert Dijkman, Patricia Wang, Xue et al.

    Source: Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 2025 Supplement; Vol. 31.

    Journal Info: Publisher: Oxford University Press / USA ISSN: 1431-9276

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  4. 4

    Maskless milling of diamond by a focused oxygen ion beam.

    Authors: Martin, Aiden A. Randolph, Steven Botman, Aurelien et al.

    Source: Scientific Reports. 3/13/2015, p8958. 1p.

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  5. 5

    Merging Machine Learning and TriBeam Tomography for 3D Defect Detection in an AM CoNi-Based Superalloy.

    Authors: Lamb, James Echlin, McLean Polonsky, Andrew et al.

    Source: Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 2022 Supplement; Vol. 28.

    Journal Info: Publisher: Oxford University Press / USA ISSN: 1431-9276

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  6. 6

    3D Characterization of a Novel CoNi-superalloy for Additive Manufacturing.

    Authors: Polonsky, Andrew Francis, Toby Pusch, Kira et al.

    Source: Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 2020Supplement2; Vol. 26 (S2).

    Journal Info: Publisher: Oxford University Press / USA ISSN: 1431-9276

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