Search Results - "Burghammer M"

Thermal- and stress-induced lattice distortions in a single Kevlar49 fibre studied by microfocus X-ray diffraction.

Authors: Davies, R. J. Burghammer, M.

Source: Journal of Materials Science; Sep2009, Vol. 44 Issue 18, p4806-4813, 8p

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Microfocus x-ray study of selective area epitaxy of SiGe on Si.

Authors: Giannakopoulos, K. P. Roth, S. Burghammer, M.

Source: Journal of Applied Physics; January 1 2003, Vol. 93 Issue 1, p259-264, 6p

Inhomogeneity of charge-density-wave order and quenched disorder in a high-Tc superconductor.

Authors: Campi, G. Bianconi, A. Poccia, N. et al.

Source: Nature. 9/17/2015, Vol. 525 Issue 7569, p359-362. 4p. 3 Graphs.

Subjects: High temperature superconductivity, Charge density waves, Quenched disorder (Quantum mechanics), Inhomogeneous materials, X-ray diffraction, Probability density function, Nanoscience, Superconductivity, Charts, diagrams, etc.

In(Ga)As/GaAs(001) quantum dot molecules probed by nanofocus high resolution x-ray diffraction with 100 nm resolution.

Authors: Dubslaff, M. Hanke, M. Burghammer, M.

Source: Applied Physics Letters; May 23 2011, Vol. 98 Issue 21, p213105-1-213105-3, 3p

Self-assembled gradient nanoparticle-polymer multilayers investigated by an advanced characterization method: microbeam grazing incidence x-ray scattering.

Authors: Roth, S. V. Burghammer, M. Riekel, C.

Source: Applied Physics Letters; March 24 2003, Vol. 82 Issue 12, p1935-1937, 3p

Synchrotron radiation microdiffraction of ballistic molten wax microdrops.

Authors: Graceffa, R. Burghammer, M. Davies, R. J.

Source: Review of Scientific Instruments; August 2008, Vol. 79 Issue 8, p086106-086106, 1p

Microcrystallography with an X-ray waveguide.

Authors: Muller, M. Burghammer, M. Flot, D. et al.

Source: Journal of Applied Crystallography. Oct2000, Vol. 33 Issue 5, p1231. 10p. 10 Diagrams, 1 Chart, 12 Graphs.

Subjects: Waveguides, Optics

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Combinatorial refinement of thin-film microstructure, properties and process conditions: iterative nanoscale search for self-assembled TiAlN nanolamellae.

Authors: Zalesak, J. Todt, J. Pitonak, R. et al.

Source: Journal of Applied Crystallography; Dec2016, Vol. 49 Issue 6, p2217-2225, 8p

X-ray nanodiffraction in forward scattering and Bragg geometry of a single isolated Ag–Au nanowire.

Authors: Fernández, S. Richard, M.I. Floettoto, D. et al.

Source: Thin Solid Films; Oct2016 Part A, Vol. 617, p9-13, 5p

Precipitate scanning in Ni-base γ/γ^′-superalloys

Authors: Roth, S.V. Burghammer, M. Gilles, R. et al.

Source: Nuclear Instruments & Methods in Physics Research Section B. Jan2003, Vol. 200 Issue 1-4, p255. 6p.

Subjects: Optical diffraction, Heat resistant alloys

Raster microdiffraction with synchrotron radiation of hydrated biopolymers with nanometre step-resolution: case study of starch granules.

Authors: Riekel, C. Burghammer, M. Davies, R. J. et al.

Source: Journal of Synchrotron Radiation. Nov2010, Vol. 17 Issue 6, p743-750. 8p.

Subjects: X-ray research, Starch, Synchrotron radiation, Potatoes

X-ray nanodiffraction analysis of stress oscillations in a W thin film on through-silicon via.

Authors: Todt, J. Hammer, H. Sartory, B. et al.

Source: Journal of Applied Crystallography; Feb2016, Vol. 49 Issue 1, p182-187, 5p

Imaging regenerating bone tissue based on neural networks applied to micro-diffraction measurements.

Authors: Campi, G. Pezzotti, G. Fratini, M. et al.

Source: Applied Physics Letters; 12/16/2013, Vol. 103 Issue 25, p253703, 4p, 1 Diagram, 4 Graphs

Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film.

Authors: Bartosik, M. Daniel, R. Mitterer, C. et al.

Source: Thin Solid Films; Sep2013, Vol. 542, p1-4, 4p

Combinatorial investigation of the isolated nanoparticle to coalescent layer transition in a gradient sputtered gold nanoparticle layer on top of polystyrene.

Authors: Roth, S. V. Walter, H. Burghammer, M.

Source: Applied Physics Letters; January 9 2006, Vol. 88 Issue 2, p021910-021910, 1p

Simultaneous microRaman and synchrotron radiation microdiffraction: Tools for materials characterization.

Authors: Davies, R. J. Burghammer, M. Riekel, C.

Source: Applied Physics Letters; December 26 2005, Vol. 87 Issue 26, p264105-264105, 1p

Coherence-matched microfocusing of hard x rays.

Authors: Nöhammer, B. David, C. Burghammer, M.

Source: Applied Physics Letters; April 18 2005, Vol. 86 Issue 16, p163104-163104, 1p