Search Results - "Burkhardt, David H."

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    Source: Conference on Computer Vision and Pattern Recognition Workshops. IEEE Computer Society Conference on Computer Vision and Pattern Recognition. Workshops [Conf Comput Vis Pattern Recognit Workshops] 2008 Jun; Vol. 2008.

    Publication Type: Journal Article

    Journal Info: Publisher: Institute of Electrical and Electronics Engineers Country of Publication: United States NLM ID: 101554644 Publication Model: Print Cited Medium: Print ISSN: 2160-7508 (Print) Linking ISSN: 21607508 NLM ISO Abbreviation: Conf Comput Vis Pattern Recognit Workshops Subsets: PubMed not MEDLINE