Search Results - "Butler Z"

Low-frequency noise in deep-submicron metal-oxide-semiconductor field-effect transistors.

Authors: Çelik-Butler, Z.

Source: IEE Proceedings -- Circuits, Devices & Systems; February 2002, Vol. 149 Issue 1, p23-31, 9p

Dielectric loss and related noise of pyroelectric modified lead titanate arrays.

Authors: Leonov, V. N. Butler, D. P. Çelik-Butler, Z. et al.

Source: Solid-State Electronics; May 2001, Vol. 45 Issue 5, p735-741, 7p

Investigation of semiconducting YBaCuO thin films: a new room temperature bolometer.

Authors: Shan, P. C. Çelik-Butler, Z. Butler, D. P.

Source: Journal of Applied Physics; December 15 1996, Vol. 80, p7118-7123, 6p

Semiconducting YBaCuO thin films for uncooled infrared bolometers.

Authors: Shan, P. C. Çelik-Butler, Z. Butler, D. P.

Source: Journal of Applied Physics; December 15 1995, Vol. 78, p7334-7339, 6p

Studies and implications of the Hall effect in superconducting and semiconducting YBa2Cu3O7-δ thin films.

Authors: Jahanzeb, A. Çelik-Butler, Z. Shan, P. C.

Source: Journal of Applied Physics; December 1 1995, Vol. 78, p6658-6663, 6p

Charge transport in amorphous and tetragonal semiconducting YBaCuO films.

Authors: Çelik-Butler, Z. Shan, P. C. Butler, D. P.

Source: Solid-State Electronics; June 1997, Vol. 41, p895-899, 5p

1/f noise as an electromigration characterization tool for W-plug vias between TiN/Al-Cu/TiN metallizations.

Authors: Çelik-Butler, Z.

Source: Solid-State Electronics; July 1996, Vol. 39, p999-1003, 5p

1/f noise and electromigration in multilayered via structures.

Authors: Çelik-Butler, Z. Zhang, R. Patel, N.

Source: Solid-State Electronics; February 1996, Vol. 39, p281-286, 6p

Determination of active oxide trap density and 1/f noise mechanism in RESURF LDMOS transistors.

Authors: Çelik-Butler, Z. Mahmud, M.I. Hao, P. et al.

Source: Solid-State Electronics. Sep2015, Vol. 111, p141-146. 6p.

Subjects: Metal oxide semiconductor field-effect transistors, Charge carrier mobility, Silicon oxide, Scattering (Physics), Electric conductivity, Electric resistance

Effect of Stress-Induced Degradation in LDMOS \1/f Noise Characteristics.

Authors: Mahmud, M. I. Celik-Butler, Z. Hao, P. et al.

Source: IEEE Electron Device Letters. Jan2012, Vol. 33 Issue 1, p107-109. 3p.

Subjects: Electronic noise, Strains & stresses (Mechanics), Metal oxide semiconductors, Surfaces (Technology), Radio frequency, Silica, Interfaces (Physical sciences), High voltages, Electric resistance

Random telegraph signals originating from unrelaxed neutral oxygen vacancy centres in SiO2.

Authors: Nour, M. Çelik‐Butler, Z. Sonnet, A. et al.

Source: Electronics Letters (Wiley-Blackwell). Oct2015, Vol. 51 Issue 20, p1610-1611. 2p.

Random telegraph signals originating from unrelaxed neutral oxygen vacancy centres in SiO2.

Authors: Nour, M. Çelik‐Butler, Z. Sonnet, A. et al.

Source: Electronics Letters (Wiley-Blackwell). Oct2015, Vol. 51 Issue 20, p1610-1611. 2p.

Random telegraph signals originating from unrelaxed neutral oxygen vacancy centres in SiO2.

Authors: Nour, M. Çelik‐Butler, Z. Sonnet, A. et al.

Source: Electronics Letters (Wiley-Blackwell); Oct2015, Vol. 51 Issue 20, p1610-1611, 2p

Human Platelet Releasate (hPR) - A xeno-free supplement for the expansion of stem cells.

Authors: Srinivasan, A. Wehmeyer, J. Pentakota, K. et al.

Source: Cytotherapy (Elsevier Inc.). 2020 Supplement, Vol. 22, pS39-S40. 2p.

Assessing Treatment Outcomes of Chondromyxoid Fibroma: A Case Series.

Authors: Butler Z Riley D Murray M et al.

Source: Cureus [Cureus] 2026 Jan 12; Vol. 18 (1), pp. e101344. Date of Electronic Publication: 2026 Jan 12 (Print Publication: 2026).

Publication Type: Journal Article

Journal Info: Publisher: Cureus, Inc Country of Publication: United States NLM ID: 101596737 Publication Model: eCollection Cited Medium: Print ISSN: 2168-8184 (Print) Linking ISSN: 21688184 NLM ISO Abbreviation: Cureus Subsets: PubMed not MEDLINE

Impact of Proximity to an Academic Health Center on Adherence to the National Comprehensive Cancer Network (NCCN) Guidelines in Patients With Soft Tissue Sarcomas.

Authors: Butler Z Riley DJ Crosse M et al.

Source: Cureus [Cureus] 2025 Oct 01; Vol. 17 (10), pp. e93647. Date of Electronic Publication: 2025 Oct 01 (Print Publication: 2025).

Publication Type: Journal Article

Journal Info: Publisher: Cureus, Inc Country of Publication: United States NLM ID: 101596737 Publication Model: eCollection Cited Medium: Print ISSN: 2168-8184 (Print) Linking ISSN: 21688184 NLM ISO Abbreviation: Cureus Subsets: PubMed not MEDLINE

Shifts in rain-snow partitioning drive faster water transit times in the US Pacific Northwest.

Authors: Butler Z Good SP Hu H et al.

Source: Scientific reports [Sci Rep] 2026 Apr 01; Vol. 16 (1). Date of Electronic Publication: 2026 Apr 01.

Publication Type: Journal Article

Journal Info: Publisher: Nature Publishing Group Country of Publication: England NLM ID: 101563288 Publication Model: Electronic Cited Medium: Internet ISSN: 2045-2322 (Electronic) Linking ISSN: 20452322 NLM ISO Abbreviation: Sci Rep Subsets: MEDLINE; PubMed not MEDLINE

Clinical Challenges and Evolving Treatments in Desmoid Fibromatosis: A Single Institution Experience.

Authors: Yu A Butler Z Honore L et al.

Source: Cancer investigation [Cancer Invest] 2025 Apr; Vol. 43 (4), pp. 257-266. Date of Electronic Publication: 2025 Apr 21.

Publication Type: Journal Article

Journal Info: Publisher: Taylor & Francis Country of Publication: England NLM ID: 8307154 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1532-4192 (Electronic) Linking ISSN: 07357907 NLM ISO Abbreviation: Cancer Invest Subsets: MEDLINE

Characterizing the Transformation and Diagnosis of Atypical Lipomatous Tumor to Dedifferentiated Liposarcoma: Single Institutional Outcomes.

Authors: Butler Z Yu A Honore L et al.

Source: Journal of surgical oncology [J Surg Oncol] 2025 Mar; Vol. 131 (3), pp. 507-513. Date of Electronic Publication: 2024 Oct 10.

Publication Type: Journal Article

Journal Info: Publisher: Wiley-Liss Country of Publication: United States NLM ID: 0222643 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1096-9098 (Electronic) Linking ISSN: 00224790 NLM ISO Abbreviation: J Surg Oncol Subsets: MEDLINE

The Impact of Chondrosarcoma with Positive Margins and Extraosseous Extension on Patient Outcomes.

Authors: Yu A Poulson T Butler Z et al.

Source: Journal of surgical oncology [J Surg Oncol] 2025 Mar; Vol. 131 (4), pp. 703-711. Date of Electronic Publication: 2024 Nov 07.

Publication Type: Journal Article

Journal Info: Publisher: Wiley-Liss Country of Publication: United States NLM ID: 0222643 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1096-9098 (Electronic) Linking ISSN: 00224790 NLM ISO Abbreviation: J Surg Oncol Subsets: MEDLINE