Search Results - "Carette, M."
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Authors: et al.
Source: Journal of Materials Science: Materials in Electronics; Aug2018, Vol. 29 Issue 15, p13254-13264, 11p
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Source: Measurement Science & Technology; March 2003, Vol. 14 Issue 3, p323-328, 6p
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Authors: et al.
Source: IEEE Transactions on Nuclear Science. Apr2022, Vol. 69 Issue 4, p840-848. 9p.
Subjects: Massachusetts Institute of Technology, Nuclear energy, Calorimeters, Nuclear reactors, Heat transfer, Research reactors, Irradiation, Thermal resistance
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Authors: et al.
Source: Lancet. 12/14/2002, Vol. 360 Issue 9349, p1914-1920. 7p.
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Authors: et al.
Source: IEEE Transactions on Nuclear Science; Nov2020, Vol. 67 Issue 11, p2405-2414, 10p
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Authors: et al.
Source: IEEE Transactions on Nuclear Science; Sep2018, Vol. 65 Issue 9, p2461-2470, 10p
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Authors: et al.
Source: Thin Solid Films. Aug2015, Vol. 589, p783-791. 9p.
Subjects: Optical properties of titanium dioxide, Ion bombardment, Crystal structure, Thin films, Oxygen, Inductively coupled plasma spectrometry, Silicon
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Authors: et al.
Source: Vacuum; Sep2016, Vol. 131, p231-239, 9p
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Authors: et al.
Source: IEEE Transactions on Nuclear Science; Aug2016 Part 2, Vol. 63 Issue b4, p2323-2330, 8p
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Authors: et al.
Source: Thin Solid Films. Nov2012, Vol. 522, p366-371. 6p.
Subjects: Silicon, Ellipsometry, Titanium dioxide films, Plasma-enhanced chemical vapor deposition, Low temperatures, Pressure, Refractive index
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Authors: et al.
Source: Applied Surface Science. Oct2013, Vol. 283, p234-239. 6p.
Subjects: Ellipsometry, Titanium dioxide films, Plasma-enhanced chemical vapor deposition, Crystal growth, Surface morphology, Scanning electron microscopy
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Authors: et al.
Source: Applied Physics Letters; 12/1/2014, Vol. 105 Issue 22, p1-4, 4p, 1 Black and White Photograph, 1 Chart, 2 Graphs
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Authors: et al.
Source: IEEE Transactions on Nuclear Science; Oct2014 Part 2, Vol. 61 Issue 5, p2515-2526, 12p
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Authors: et al.
Source: IEEE Transactions on Nuclear Science; Aug2014 Part 2, Vol. 61 Issue 4, p2254-2261, 8p
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Authors: et al.
Source: Applied Physics Letters; 2/11/2013, Vol. 102 Issue 6, p061903, 4p, 1 Diagram, 2 Graphs
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Authors: et al.
Source: IEEE Transactions on Nuclear Science; Dec2012 Part 2, Vol. 59 Issue 6, p3173-3179, 7p