Search Results - "Codegoni, D."

Giant Spin‐Charge Conversion in Ultrathin Films of the MnPtSb Half‐Heusler Compound.

Authors: Longo, E. Markou, A. Felser, C. et al.

Source: Advanced Functional Materials; 12/2/2024, Vol. 34 Issue 49, p1-10, 10p

Nanoscale reinforcement of polypropylene composites with carbon nanotubes and clay: Dispersion state, electromagnetic and nanomechanical properties.

Authors: Petrova, I. Kotsilkova, R. Ivanov, E. et al.

Source: Polymer Engineering & Science; Mar2016, Vol. 56 Issue 3, p269-277, 9p

Investigation of irradiated monolithic transistors for space applications

Authors: Codegoni, D. Colder, A. Croitoru, N. et al.

Source: Nuclear Instruments & Methods in Physics Research Section B. Mar2004, Vol. 217 Issue 1, p65. 12p.

Subjects: Astrophysical radiation, Electronics, Neutrons, Bipolar transistors

Leakage current and deep levels in CoSi2 silicided junctions

Authors: Codegoni, D. Carnevale, G.P. De Marco, C. et al.

Source: Materials Science & Engineering: B. Dec2005, Vol. 124-125, p349-353. 5p.

Subjects: Cobalt, Transition metals, Spectrum analysis, Deep level transient spectroscopy

The Impact Of Organic Contamination On The Oxide-Silicon Interface.

Authors: Codegoni, D. Polignano, M. L. Castellano, L. et al.

Source: AIP Conference Proceedings. 11/15/2011, Vol. 1395 Issue 1, p217-221. 5p.

Palladium contamination in silicon.

Authors: Polignano, M.L. Mica, I. Ceresoli, M. et al.

Source: Solid-State Electronics; Apr2015, Vol. 106, p68-77, 10p

A comparative analysis of different measurement techniques to monitor metal and organic contamination in silicon device processing.

Authors: Polignano, M. L. Codegoni, D. Grasso, S. et al.

Source: Physica Status Solidi. A: Applications & Materials Science. Mar2015, Vol. 212 Issue 3, p495-505. 11p.

Proximity gettering of slow diffuser contaminants in CMOS image sensors.

Authors: Russo, F. Moccia, G. Nardone, G. et al.

Source: Solid-State Electronics; Jan2014, Vol. 91, p91-99, 9p

Extended Defect Generation by Xenon implantation in Silicon.

Authors: Mica, I. Polignano, M. L. Mauri, A. G. et al.

Source: AIP Conference Proceedings. 2014, Vol. 1583, p64-68. 5p. 1 Black and White Photograph, 4 Charts, 2 Graphs.

Characterization of Organic Contamination in Semiconductor Manufacturing Processes.

Authors: Nutsch, A. Beckhoff, B. Bedana, G. et al.

Source: AIP Conference Proceedings. 9/28/2009, Vol. 1173 Issue 1, p23-28. 6p. 1 Chart, 6 Graphs.

Tailoring resistive switching in ultra-thin tellurium films by interface engineering.

Authors: Ghomi S Grazianetti C Serafini A et al.

Source: Nanoscale horizons [Nanoscale Horiz] 2025 Nov 17; Vol. 10 (12), pp. 3478-3485. Date of Electronic Publication: 2025 Nov 17.

Publication Type: Journal Article

Journal Info: Publisher: Royal Society of Chemistry Country of Publication: England NLM ID: 101712576 Publication Model: Electronic Cited Medium: Internet ISSN: 2055-6764 (Electronic) Linking ISSN: 20556756 NLM ISO Abbreviation: Nanoscale Horiz Subsets: MEDLINE; PubMed not MEDLINE

Non-Volatile Resistive Switching in Nanoscaled Elemental Tellurium by Vapor Transport Deposition on Gold.

Authors: Ghomi S Martella C Lee Y et al.

Source: Advanced science (Weinheim, Baden-Wurttemberg, Germany) [Adv Sci (Weinh)] 2025 Jan; Vol. 12 (1), pp. e2406703. Date of Electronic Publication: 2024 Oct 01.

Publication Type: Journal Article

Journal Info: Publisher: WILEY-VCH Country of Publication: Germany NLM ID: 101664569 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 2198-3844 (Electronic) Linking ISSN: 21983844 NLM ISO Abbreviation: Adv Sci (Weinh) Subsets: MEDLINE; PubMed not MEDLINE

Terahertz and Infrared Plasmon Polaritons in PtTe2 Type-II Dirac Topological Semimetal.

Authors: Macis S D'Arco A Mosesso L et al.

Source: Advanced materials (Deerfield Beach, Fla.) [Adv Mater] 2024 Jul; Vol. 36 (29), pp. e2400554. Date of Electronic Publication: 2024 May 22.

Publication Type: Journal Article

Journal Info: Publisher: Wiley-VCH Country of Publication: Germany NLM ID: 9885358 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1521-4095 (Electronic) Linking ISSN: 09359648 NLM ISO Abbreviation: Adv Mater Subsets: MEDLINE; PubMed not MEDLINE

Plasma-Assisted Atomic Layer Deposition of IrO2 for Neuroelectronics.

Authors: Di Palma V Pianalto A Perego M et al.

Source: Nanomaterials (Basel, Switzerland) [Nanomaterials (Basel)] 2023 Mar 08; Vol. 13 (6). Date of Electronic Publication: 2023 Mar 08.

Publication Type: Journal Article

Journal Info: Publisher: MDPI AG Country of Publication: Switzerland NLM ID: 101610216 Publication Model: Electronic Cited Medium: Print ISSN: 2079-4991 (Print) Linking ISSN: 20794991 NLM ISO Abbreviation: Nanomaterials (Basel) Subsets: PubMed not MEDLINE

Extreme Bendability of Atomically Thin MoS2 Grown by Chemical Vapor Deposition Assisted by Perylene-Based Promoter.

Authors: Martella C Campi D Tummala PP et al.

Source: Nanomaterials (Basel, Switzerland) [Nanomaterials (Basel)] 2022 Nov 17; Vol. 12 (22). Date of Electronic Publication: 2022 Nov 17.

Publication Type: Journal Article

Journal Info: Publisher: MDPI AG Country of Publication: Switzerland NLM ID: 101610216 Publication Model: Electronic Cited Medium: Print ISSN: 2079-4991 (Print) Linking ISSN: 20794991 NLM ISO Abbreviation: Nanomaterials (Basel) Subsets: PubMed not MEDLINE

Optical Conductivity of Two-Dimensional Silicon: Evidence of Dirac Electrodynamics.

Authors: Grazianetti C De Rosa S Martella C et al.

Source: Nano letters [Nano Lett] 2018 Nov 14; Vol. 18 (11), pp. 7124-7132. Date of Electronic Publication: 2018 Nov 05.

Publication Type: Journal Article; Research Support, Non-U.S. Gov't

Journal Info: Publisher: American Chemical Society Country of Publication: United States NLM ID: 101088070 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1530-6992 (Electronic) Linking ISSN: 15306984 NLM ISO Abbreviation: Nano Lett Subsets: PubMed not MEDLINE