Search Results - "Depth profiling"

Quantitative Depth Estimation in Lock-In Thermography: Modeling and Correction of Lateral Heat Conduction Effects.

Authors: Ma, Botao Sun, Shupeng Zhang, Lin

Source: Materials (1996-1944). Nov2025, Vol. 18 Issue 22, p5247. 22p.

Subjects: Depth profiling, Nondestructive testing, Calibration, Titanium alloys, Thermography, Heat transfer

Interface identification in micro-LED repair applications via depth profiling using femtosecond laser-induced breakdown spectroscopy.

Authors: Jung, Woonkyeong Choi, Janghee Jeon, Gookseon et al.

Source: Scientific Reports. 11/19/2025, Vol. 15 Issue 1, p1-9. 9p.

Application of Glow Discharge Atomic Emission Spectrometry to Layer-by-Layer Analysis of Zinc-Coated Steels.

Authors: Lepilina, M. Yu. Yakubenko, E. V. Ermolaeva, T. N. et al.

Source: Journal of Analytical Chemistry. Jun2026, Vol. 81 Issue 6, p1025-1035. 11p.

Subjects: Glow discharges, Depth profiling, Zinc alloys, Galvanized steel, Calibration, Sputtering (Physics), Metallurgical analysis, Alloys

Implementation of depth‐resolved Laue microdiffraction by wire profiling at the Shanghai Synchrotron Radiation Facility.

Authors: Wang, You-Kang Yang, Yi-Ming Li, Run-Guang et al.

Source: Journal of Applied Crystallography. Jun2026, Vol. 59 Issue 3, p923-931. 9p.

Subjects: Depth profiling, Synchrotrons, X-ray diffraction, Solids, Crystallography, Elastic deformation

Geographic Terms: China

Rutherford backscattering spectrometry: A multimodal ion beam analysis technique for evaluating elemental depth profiles and radiation hardness for space photovoltaics applications.

Authors: Parashar, Mritunjaya Sharma, Mohin Saini, Darshpreet Kaur et al.

Source: APL Energy. Sep2025, Vol. 3 Issue 3, p1-17. 17p.

Depth Correction of TOF-SIMS Depth Profiling Images Using the Total Ion Count Images.

Authors: Brunet, Melanie A. Gorman, Brittney L. Kraft, Mary L.

Source: Biomolecules (2218-273X). Sep2025, Vol. 15 Issue 9, p1237. 14p.

Molecular 3D Characterisation of Drug Distribution and Mg‐Stearate Coating on Lactose Carrier Particles by ToF‐SIMS and XPS.

Authors: Sjövall, Peter Ernstsson, Marie Mahlin, Denny et al.

Source: Surface & Interface Analysis: SIA. May2025, Vol. 57 Issue 5, p334-342. 9p.

Subjects: Particulate matter, Depth profiling, Drug efficacy, Lactose, Budesonide

Vertical profiling of micro-plastics in agricultural soils: polymer types, metal interactions, and implication on crop rooting zones.

Authors: Kumari, Akanksha Chakraborty, Sukalyan

Source: Environmental Monitoring & Assessment. Apr2026, Vol. 198 Issue 4, p1-20. 20p.

Subject Terms: *Microplastics, *Depth profiling, *Polymers, *Metal absorption & adsorption, *Plant roots, *Soil pollution, *Soil quality, *Soils

Geographic Terms: Ranchi (India)

Elemental Depth Profiling in Perovskite Solar Cells by Rutherford Backscattering Spectrometry.

Authors: Hussain, Taimoor Abbas, Turab Ali Liu, Kong et al.

Source: Journal of Electronic Materials. Mar2026, Vol. 55 Issue 3, p2581-2587. 7p.

Subjects: Rutherford backscattering spectrometry, Depth profiling, Perovskite, Simulation software, Photovoltaic power generation, Solar cells, Ion migration & velocity

Consolidating Lime Mortar with Nanolime: The Effect of the Ethanol:Water Ratio.

Authors: Busschots, Eva De Kock, Tim Berto, Tanaquil et al.

Source: Studies in Conservation. Jul2025, Vol. 70 Issue 5, p358-366. 9p.

Boulder-Cobble Beaches, Eastern Tasman Bay, New Zealand.

Authors: Dickinson, Warren W. Hartstein, Neil D. Davidson, Robert J. et al.

Source: Journal of Coastal Research; 2025, Vol. 41 Issue 4, p551-565, 15p

Depth-Resolved Elemental Analysis by Glow Discharge Emission Spectroscopy: Practical Aspects—A Review.

Authors: Weiss, Zdeněk¹

Source: Metals (2075-4701); Jul2025, Vol. 15 Issue 7, p768, 22p

Elemental behaviors in NBS glass under subsequential γ‐irradiation and corrosion.

Authors: Zhang, Jiandong Wang, Xianglong Xia, Xiaoyu et al.

Source: International Journal of Applied Glass Science. Jul2025, Vol. 16 Issue 3, p1-8. 8p.

Surface Charging on Insulating Films with Different Thicknesses in UPS.

Authors: Zhu, Lei Xu, Xuefeng

Source: Applied Sciences (2076-3417); Jun2025, Vol. 15 Issue 12, p6846, 11p

Development of a Prototype of Industrial Installation for the Deposition of Self-Restoring Nitride Coatings on Reed Switch Contacts.

Authors: Zeltser, Igor A. Tolstoguzov, Alexander Fu, Dejun

Source: Coatings (2079-6412); May2025, Vol. 15 Issue 5, p533, 8p

A Soft‐Constraint Tikhonov Regularization Method for Depth Profiling in ARXPS.

Authors: Chen, Haonan Xu, Chunkai Wang, Enliang et al.

Source: Surface & Interface Analysis: SIA. Jun2026, p1. 9p. 7 Illustrations.

基于X射线光电子能谱溅射法的多层薄膜材料研究. (Chinese)

Authors: 杨, 森 段, 建霞 杨, 立平 et al.

Source: Chinese Journal of Inorganic Analytical Chemistry / Zhongguo Wuji Fenxi Huaxue; Jun2026, Vol. 16 Issue 6, p1072-1086, 15p

Layer-specific porosity analysis in sub-nanoporous silica thin films using variable-energy positron annihilation lifetime technique, ellipsometric porosimetry, and attenuated total reflection infrared spectroscopy.

Authors: Yoshimoto, Shigeru Ito, Kenji

Source: Review of Scientific Instruments; May2026, Vol. 97 Issue 5, p1-7, 7p

Investigation of 3D elemental distribution on the dome surface of HL-2A divertor by laser-induced breakdown spectroscopy.

Authors: Huangfu, X. R. Zhao, D. Wu, D. et al.

Source: Applied Physics B: Lasers & Optics. Apr2025, Vol. 131 Issue 4, p1-11. 11p.

Subjects: Laser-induced breakdown spectroscopy, Depth profiling, Copper, Plasma interactions, Three-dimensional imaging, Trace elements

Femtosecond Laser Ablation (fs‐LA) XPS Depth Profiling of Lead Halide Perovskite Thin Film Solar Cells.

Authors: Chandler, C. W. Devadasan, D. S. Bacon, S. R. et al.

Source: Surface & Interface Analysis: SIA. Mar2025, Vol. 57 Issue 3, p246-252. 7p.

Subjects: Depth profiling, Laser ablation, Complex ions, Ion bombardment, Lead halides, Solar cells