Search Results - "Ellipsometry"

Optical Interband Transitions in Fully Strained Ge 1−x Sn x Alloys.

Authors: Tao, Ping Li, Shaohan Wang, Lijuan

Source: Applied Sciences (2076-3417); Jun2026, Vol. 16 Issue 12, p6004, 12p

Artificial Intelligence in Ellipsometry: Methods, Challenges, and Opportunities.

Authors: Politano, Grazia Giuseppina¹

Source: Crystals (2073-4352); May2026, Vol. 16 Issue 5, p311, 16p

Ellipsometric Characterization of SiO2/Au/Cr Nanostructures for Stable SPR Sensors.

Authors: Minailova, I. Ivakhno-Tsehelnyk, O. Shamrovska, P. et al.

Source: Journal of Nano- & Electronic Physics; 2026, Vol. 18 Issue 3, p03011-1-03011-5, 5p

Operando Ellipsometric Monitoring of Solid Electrolyte Interphase Evolution on Copper: Effects of Electrolyte Chemistry on Interphase Growth Kinetics.

Authors: Weintz, Dominik Dopilka, Andrew Ready, Austin D. et al.

Source: Small Structures. Apr2026, Vol. 7 Issue 4, p1-11. 11p.

A New Method of Evaluating Multi-Color Ellipsometric Mapping on Big-Area Samples.

Authors: Kálvin, Sándor Zereay, Berhane Nugusse Juhász, György et al.

Source: Sci (2413-4155). Jan2026, Vol. 8 Issue 1, p17. 28p.

Error metrics in modeling and optimization of the straight-core lossy mode resonance-based sensors.

Authors: Szymański, Michał Bator, Marcin Gajowniczek, Krzysztof

Source: Advances in Science & Technology Research Journal; 2025, Vol. 19 Issue 10, p436-443, 8p

Optical Studies of Al 2 O 3 :ZnO and Al 2 O 3 :TiO 2 Bilayer Films in UV-VIS-NIR Spectral Range.

Authors: Tram, Maciej Nosidlak, Natalia Szindler, Magdalena M. et al.

Source: Applied Sciences (2076-3417); Dec2025, Vol. 15 Issue 24, p12870, 19p

Spectroscopic Ellipsometry and Luminescence Properties of Low Temperature Sputter-Deposited Zinc Oxide Thin Films: Cryogenic Self-Stress-Induced Crystallization.

Authors: Ebdah, M. A. Kordesch, M. E. Yuan, W. et al.

Source: Crystals (2073-4352); Dec2025, Vol. 15 Issue 12, p1031, 21p

Rotating compensator spectroscopic ellipsometry based on frequency division multiplexing with retardation calibration.

Authors: Park, Jongkyoon Gliserin, Alexander Choi, Sukhyun et al.

Source: Scientific Reports. 11/27/2025, Vol. 15 Issue 1, p1-12. 12p.

Metrology of ultrathin iron catalyst films by spectroscopic ellipsometry.

Authors: Allen, Nicholas E. Linford, Matthew R. Allred, David D. et al.

Source: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films. Jul2026, Vol. 44 Issue 4, p1-11. 11p.

Subjects: Iron catalysts, Ellipsometry, Iron oxidation, Thin films, Nanotubes, Optical constants

Optical functions of crystalline and amorphous TeO2.

Authors: Jellison Jr., G. E. Cureton, W. F. Bian, S. et al.

Source: Surface Science Spectra. Jun2026, Vol. 33 Issue 1, p1-12. 12p.

Subjects: Ellipsometry, Tellurium oxides, Permittivity, Absorption coefficients, Optical properties, Birefringence

Optical Characterization of Silicon Nitride-based Bilayer Thin Films Using Spectroscopic Ellipsometry and the Maxwell-Garnett Model.

Authors: Beddiaf, Abdelaziz Medjaldi, Malika Djamai, Djemouai et al.

Source: Electronics & Electrical Engineering; 2025, Vol. 31 Issue 5, p35-40, 6p

Mid-infrared ellipsometry enhanced by means of localized electromagnetic states of a one-dimensional photonic crystal.

Authors: Occhicone, Agostino Pea, Marialilia Polito, Raffaella et al.

Source: Scientific Reports. 8/30/2025, Vol. 15 Issue 1, p1-11. 11p.

Optical label-free detection of SARS-CoV-2: investigating platform spectroscopic properties for oligonucleotide targeting.

Authors: Rotondi, Silvia Maria Cristina Canepa, Paolo Dante, Silvia et al.

Source: European Biophysics Journal. Apr2026, Vol. 55 Issue 2, p209-216. 8p.

Subjects: Oligonucleotides, Ellipsometry, Selectivity (Psychology), Viral genomes, Optical signal detection, COVID-19 testing, Binding constant, Biosensors

Microscopic and macroscopic investigations on He bubble formation in W via in situ spectroscopic ellipsometry.

Authors: Pappalardo, F Frikha, E Mougenot, J et al.

Source: Journal of Physics D: Applied Physics. 2026, Vol. 59 Issue 8, p1-13. 13p.

Subjects: Ellipsometry, Bubble dynamics, Fusion reactors, Tungsten, Porosity, Surface roughness, Helium plasmas

Frequency spectra in the ATR mode of ellipsometric parameters of a periodic medium with a resonant defect in which polaritons are excited.

Authors: Yatsyshen, Valery¹ valeryyat@gmail.com

Source: EPJ Web of Conferences. 2/17/2025, Vol. 318, p1-7. 7p.

Comprehensive ellipsometric analysis of linear and nonlinear optical properties of GaAs for optoelectronic and communication applications.

Authors: Isik, Mehmet Gasanly, Nizami M.

Source: Journal of Materials Science; Jul2025, Vol. 60 Issue 27, p11435-11445, 11p

Laser Return-Path Ellipsometry in Monitoring Vacuum Oxidation of AISI-321 Steel.

Authors: Kotenev, V. A.¹ (AUTHOR) m-protect@mail.ru

Source: Protection of Metals & Physical Chemistry of Surfaces. Jun2025, Vol. 61 Issue 3, p751-758. 8p.

Time-domain THz characterization of semiconductors across a wide doping range by combined transmission spectroscopy and ellipsometry.

Authors: Mazaheri, Z. Casalino, M. Crisci, T. et al.

Source: Applied Physics Letters; 7/6/2026, Vol. 129 Issue 1, p1-7, 7p

Time‐Resolved Simultaneous Mapping of Thickness and Nanoparticle Concentration in Nanofluid Thin Films via Imaging Ellipsometry and Deep‐UV Reflectance Imaging.

Authors: Shoji, Eita Aizawa, Keita Kusudo, Hiroki et al.

Source: Advanced Materials Interfaces; 6/23/2026, Vol. 13 Issue 12, p1-10, 10p