Search Results - "Erasable programmable read-only memory"

Experimental Reliability Studies and SPICE Simulation for EEPROM at Temperatures up to 450°C.

Authors: Kelberer, A. Dreiner, S. Grella, K. et al.

Source: Journal of Microelectronic & Electronic Packaging. 2016 1st Quarter, Vol. 13 Issue 1, p33-37. 5p.

Subjects: Silicon polymers, Erasable programmable read-only memory, Simulation Program with Integrated Circuit Emphasis, High temperature electronics, Electronic equipment, Reliability in engineering

Floating Gate EPROM Instability for True Randomness Generation.

Authors: Genoff, Jordan Genoff¹ jgenoff@tu-plovdiv.bg

Source: Annual Journal of Electronics. 2014, Vol. 8, p124-127. 4p.

A low-cost UHF RFID tag chip with AES cryptography engine.

Authors: Fu, Lingzhi Shen, Xiang Zhu, Linghao et al.

Source: Security & Communication Networks; Feb2014, Vol. 7 Issue 2, p365-375, 11p

SPPC: a new tree structure for mining erasable patterns in data streams.

Authors: Le, Tuong Vo, Bay Fournier-Viger, Philippe et al.

Source: Applied Intelligence. Feb2019, Vol. 49 Issue 2, p478-495. 18p.

Subjects: Erasable programmable read-only memory, Data mining, Decision making, Planography, Meta-analysis

Enhanced Performance of Single Poly-Silicon EEPROM Cell With a Tungsten Finger Coupling Structure by Full CMOS Process.

Authors: Chung, Chih-Ping Chang-Liao, Kuei-Shu Chen, Chun-Yuan

Source: IEEE Transactions on Electron Devices. Sep2014, Vol. 61 Issue 9, p3075-3080. 6p.

Subjects: Erasable programmable read-only memory, Complementary metal oxide semiconductors, Nonvolatile memory, Polycrystalline silicon, Programmable read-only memory

Access resistor modelling for EEPROM’s retention test vehicle.

Authors: Canet, P. Postel-Pellerin, J. Ogier, J.L.

Source: Microelectronics Reliability. Sep2013, Vol. 53 Issue 9-11, p1218-1223. 6p.

Subjects: Erasable programmable read-only memory, Electric resistors, Mathematical models, Threshold voltage, Computer programming, Gate array circuits

Procedure of calculating parameters of sense amplifiers for the EEPROM and flash memory.

Authors: Vasil'ev, E.¹ vaseugser@mail.ru

Source: Russian Microelectronics. Dec2013, Vol. 42 Issue 7, p414-419. 6p.

Subjects: Erasable programmable read-only memory, Electronic amplifiers design & construction, Parameters (Statistics), Flash memory, Temperature effect, Electric potential, Complementary metal oxide semiconductors, Nonvolatile memory

A non-erasable magnetic memory based on the magnetic permeability.

Authors: Petrie, J.R. Wieland, K.A. Burke, R.A. et al.

Source: Journal of Magnetism & Magnetic Materials. Jun2014, Vol. 361, p262-266. 5p.

Subjects: Erasable programmable read-only memory, Magnetic memory (Computers), Magnetic permeability, Sputtering (Physics), Metallic glasses

An Ultra Low-Power Solution for EEPROM in Passive UHF RFID Tag IC With a Novel Read Circuit and a Time-Divided Charge Pump.

Authors: Du, Yongqian Zhuang, Yiqi Li, Xiaoming et al.

Source: IEEE Transactions on Circuits & Systems. Part I: Regular Papers. Aug2013, Vol. 60 Issue 8, p2177-2186. 10p.

Subjects: Erasable programmable read-only memory, UHF devices, Radio frequency identification systems, On-chip charge pumps, Passive components

Design Techniques for a 30-ns Access Time 1.5-V 200-KB Embedded EEPROM Memory.

Authors: Xu, Yiran Hu, Jian Xiao, Jun et al.

Source: IEEE Transactions on Circuits & Systems. Part II: Express Briefs; Nov2016, Vol. 63 Issue 11, p1064-1068, 5p

A page-granularity wear-leveling (PGWL) strategy for NAND flash memory-based sink nodes in wireless sensor networks.

Authors: Wei, Debao Deng, Libao Zhang, Peng et al.

Source: Journal of Network & Computer Applications; Mar2016, Vol. 63, p125-139, 15p

Single-Event Effect Performance of a Conductive-Bridge Memory EEPROM.

Authors: Chen, Dakai Wilcox, Edward Berg, Melanie et al.

Source: IEEE Transactions on Nuclear Science; Dec2015 Part 1, Vol. 62 Issue 6a, p2703-2708, 6p

A Highly Scalable Single Poly-Silicon Embedded Electrically Erasable Programmable Read Only Memory With Tungsten Control Gate by Full CMOS Process.

Authors: Chung, Chih-Ping Chang-Liao, Kuei-Shu

Source: IEEE Electron Device Letters. Apr2015, Vol. 36 Issue 4, p336-338. 3p.

Subjects: Tungsten, Erasable programmable read-only memory, Complementary metal oxide semiconductors, Metal insulator semiconductors, Integrated circuits

Half-MOS Based Single-Poly EEPROM Cell With Program and Erase Bit Granularity.

Authors: Torricelli, Fabrizio Milani, Luca Colalongo, Luigi et al.

Source: IEEE Electron Device Letters. Dec2013, Vol. 34 Issue 12, p1509-1511. 3p.

Subjects: Flash memory, Erasable programmable read-only memory, Complementary metal oxide semiconductors, Computer programming, Threshold voltage, Information technology research

Physical Unclonable Functions and Applications: A Tutorial.

Authors: Herder, Charles Yu, Meng-Day Koushanfar, Farinaz et al.

Source: Proceedings of the IEEE; Aug2014, Vol. 102 Issue 8, p1126-1141, 16p

MEI: An efficient algorithm for mining erasable itemsets.

Authors: Le, Tuong Vo, Bay

Source: Engineering Applications of Artificial Intelligence; Jan2014, Vol. 27, p155-166, 12p

3-D Stacking of Ultrathin Chip Packages: An Innovative Packaging and Interconnection Technology.

Authors: Priyabadini, Swarnakamal Sterken, Tom Van Hoorebeke, Luc et al.

Source: IEEE Transactions on Components, Packaging & Manufacturing Technology; Jul2013, Vol. 3 Issue 7, p1114-1122, 9p

Two-Dimensional Light Diffraction from an EPROM Chip.

Authors: Ekkens, Tom¹ (AUTHOR)

Source: Physics Teacher. Feb2018, Vol. 56 Issue 2, p70-71. 2p.

Subjects: Erasable programmable read-only memory, Diffraction patterns, Optical diffraction, Dimensional analysis, Fourier series, Crystallography

Using Linux with EFI.

Authors: SMITH, RODERICK W.

Source: Linux Journal; Dec2011, Issue 212, p86-92, 7p

Challenging Your Own Patent — Know the Limitations.

Authors: Heines, M. Henry

Source: Chemical Engineering Progress; Jun2017, Vol. 113 Issue 6, p55-55, 1p