Search Results - "Estevez-Rams, E."

Trajectory classification through Freeman's curve encoding and entropic analysis.

Authors: Peña-Mendieta R Mesa-Rodríguez A Estevez-Moya D et al.

Source: PloS one [PLoS One] 2025 Nov 04; Vol. 20 (11), pp. e0334694. Date of Electronic Publication: 2025 Nov 04 (Print Publication: 2025).

Publication Type: Journal Article

Journal Info: Publisher: Public Library of Science Country of Publication: United States NLM ID: 101285081 Publication Model: eCollection Cited Medium: Internet ISSN: 1932-6203 (Electronic) Linking ISSN: 19326203 NLM ISO Abbreviation: PLoS One Subsets: MEDLINE

MATHEMATICAL TREATMENT OF THE CANONICAL FINITE STATE MACHINE FOR THE ISING MODEL.

Alternate Title: TRATAMIENTO MATEMÁTICO DE LA MÁQUINA CANÓNICA DE ESTADO FINITO PARA EL MODELO DE ISING.

Authors: ESTEVEZ-RAMs, E. RODRÍGUEZ-HORTA, E. LORA-SERRANO, R.

Source: Revista Cubana de Física. 7/15/2025, Vol. 42 Issue 1, p3-11. 9p.

Experimental Investigation and Thermodynamic Optimization of the Co–Fe–Nb System.

Authors: Ye, Daomin Yang, Bo Guo, Cuiping et al.

Source: Metallurgical & Materials Transactions. Part A; Aug2025, Vol. 56 Issue 8, p3208-3231, 24p

N-Gene and T-Gene deregulation networks: a data-driven causal framework for the analysis of gene interventions in cancer.

Authors: Castel, Frank Herrero, Roberto Gómez, Jean Pierre et al.

Source: Frontiers in Systems Biology. 2026, p1-15. 15p.

USE OF A CONVOLUTION METHOD AT LINEAR INTERVALS IN X-RAY DIFFRACTION PROFILES.

Alternate Title: EMPLEO DE MEÍTODO DE CONVOLUCIOÍN A INTERVALOS LINEALES EN PERFILES DE DIFRACCIOÍN DE RAYOS-X.

Authors: RODRÍGUEZ-HERRERA, D. M. PENTON-MADRIGAI, A. ESTEVEZ-RAMS, E.

Source: Revista Cubana de Física. 7/15/2024, Vol. 41 Issue 1, p16-21. 6p.

Subjects: CRYSTAL structure, DIFFRACTION patterns, SET functions, X-ray diffraction

Effect of Ta Interlayers on Texture and Magnetic Properties of FeSi Films with Micrometer Thickness.

Authors: He, Jialian Zhang, Zhong Bao, Zhihao et al.

Source: Materials (1996-1944). Oct2022, Vol. 15 Issue 19, p6789. 7p.

Robust Parameter Interval Identification for a Logistic-Type Fractional Difference System.

Authors: Li, Yiwei Allen-Zhao, Zhihua Song, Wenhang et al.

Source: Fractal & Fractional. Jan2026, Vol. 10 Issue 1, p29. 17p.

Leveraging word embeddings to enhance co-occurrence networks: A statistical analysis.

Authors: Amancio, Diego R. Machicao, Jeaneth Quispe, Laura V. C.

Source: PLoS ONE. 7/11/2025, Vol. 20 Issue 7, p1-17. 17p.

Complexity-entropy analysis at different levels of organisation in written language.

Authors: Estevez-Rams E Mesa-Rodriguez A Estevez-Moya D

Source: PloS one [PLoS One] 2019 May 08; Vol. 14 (5), pp. e0214863. Date of Electronic Publication: 2019 May 08 (Print Publication: 2019).

Publication Type: Journal Article; Research Support, Non-U.S. Gov't

Journal Info: Publisher: Public Library of Science Country of Publication: United States NLM ID: 101285081 Publication Model: eCollection Cited Medium: Internet ISSN: 1932-6203 (Electronic) Linking ISSN: 19326203 NLM ISO Abbreviation: PLoS One Subsets: MEDLINE

Computational capabilities at the edge of chaos for one dimensional systems undergoing continuous transitions.

Authors: Estevez-Rams, E. Estevez-Moya, D. Garcia-Medina, K. et al.

Source: Chaos. Apr2019, Vol. 29 Issue 4, pN.PAG-N.PAG. 10p. 2 Diagrams, 1 Chart, 3 Graphs.

COMPUTATIONAL MECHANICS OF COMBINED PLANAR DEFECTS: EXTRINSIC + INTRINSIC FAULTING IN 3C CLOSE PACKED CRYSTAL STRUCTURES.

Alternate Title: MECÁNICA COMPUTACIONAL DE DEFECTOS PLANARES COMBINADOS: FALLAS EXTRÍNSECA + INTRÍNSECA EN ESTRUCTURAS CRISTALINAS COMPACTAS DEL TIPO 3C.

Authors: ARAGON-FERNANDEZ, BEATRIZ ESTEVEZ-RAMS, E. LORA-SERRANO, R. et al.

Source: Revista Cubana de Física. jul2018, Vol. 35 Issue 1, p3-9. 7p.

The Rate of Entropy Production as a Lyapunov Function in Biophysical-chemical Systems.

Authors: Manuel Nieto-Villar, José Bizzarri, Mariano Mansilla, Ricardo

Source: Organisms: Journal of Biological Sciences. 2025, Vol. 8 Issue 1/2, p85-96. 12p.

High-Coercivity Ferrimagnet Co₂FeO₂BO₃: XMCD Insights into Charge-Ordering and Cation Distribution.

Authors: Platunov, Mikhail S.¹ (AUTHOR) m.s.platunov@srf-skif.ru

Source: Inorganics. Jan2025, Vol. 13 Issue 1, p24. 12p.

Dislocations in Grain Boundary Regions: The Origin of Heterogeneous Microstrains in Nanocrystalline Materials.

Authors: Zhang, Zhenbo Ódor, Éva Farkas, Diana et al.

Source: Metallurgical & Materials Transactions. Part A; Jan2020, Vol. 51 Issue 1, p513-530, 18p, 5 Diagrams, 3 Charts, 7 Graphs

Impact of magnetic field on the thermal properties of chemically synthesized Sm-Co nanoparticles based silicone oil nanofluid.

Authors: Oraon, Akash Das, Bhakti Pada Michael, Monisha et al.

Source: Journal of Thermal Analysis & Calorimetry. Feb2022, Vol. 147 Issue 3, p1933-1943. 11p.

Crystal Structure Complexity and Approximate Limits of Possible Crystal Structures Based on Symmetry-Normalized Volumes.

Authors: Tschauner, Oliver Bermanec, Marko

Source: Materials (1996-1944). Jun2024, Vol. 17 Issue 11, p2618. 14p.

A DECADE OF CUBAN PRESENCE IN SYNCHROTRON LIGHT SOURCE FACILITIES.

Alternate Title: UNA DÉCADA DE PRESENCIA CUBANA EN INSTALACIONES DE FUENTES DE LUZ SINCROTRÓN.

Authors: PENTÓN-MADRIGAL, A. ESTEVEZ-RAMS, E. REGUERA, E. et al.

Source: Revista Cubana de Física. 2013, Vol. 30 Issue 1, p36-41. 6p.

Visualizing long vectors of measurements by use of the Hilbert curve.

Authors: Estevez-Rams, E. Perez-Demydenko, C. Aragón Fernández, B. et al.

Source: Computer Physics Communications. Dec2015, Vol. 197, p118-127. 10p.

Subjects: Vector analysis, Hilbert space, Mathematical transformations, Ising model, Mathematical sequences

Fracture complexions of a nanocrystalline microstructure.

Authors: Das, Arpan¹ (AUTHOR) dasarpan1@yahoo.co.in

Source: Applied Physics A: Materials Science & Processing. Sep2023, Vol. 129 Issue 9, p1-15. 15p. 1 Color Photograph, 2 Diagrams, 2 Charts, 5 Graphs.

Multiferroic properties of PbFe12O19–PbTiO3 composite ceramics.

Authors: Mishra, Debesh D. Tewelde, Daniel M. Wang, Min et al.

Source: Journal of Materials Science: Materials in Electronics; Jun2019, Vol. 30 Issue 11, p10830-10834, 5p