Search Results - "Folomeshkin, M. S."

Experimental Study of the Method of X-ray Phase-Contrast Microscopy Using a Nanofocusing Lens at KISI-Kurchatov Synchrotron Source.

Authors: Folomeshkin, M. S. Kohn, V. G. Seregin, A. Yu. et al.

Source: Crystallography Reports. Dec2024, Vol. 69 Issue 6, p787-793. 7p.

Accurate Measurement of the Rocking Curve of a Planar Compound Refractive Lens for Synchrotron Radiation Focusing.

Authors: Folomeshkin, M. S. Kohn, V. G. Seregin, A. Yu. et al.

Source: Crystallography Reports. Dec2025, Vol. 70 Issue 6, p867-871. 5p.

Subjects: Synchrotron radiation, Synchrotron radiation sources, Diffraction patterns, Gaussian function, Optical elements

A New Method of Phase-Contrast Microscopy of Microobjects Using a Nanofocusing Lens in Synchrotron Radiation.

Authors: Folomeshkin, M. S. Kohn, V. G. Seregin, A. Yu. et al.

Source: Crystallography Reports. Oct2025, Vol. 70 Issue 5, p681-686. 6p.

Subjects: Phase-contrast microscopy, Synchrotron radiation, Carbon fibers, Nanostructures, High resolution imaging, Focus (Optics)

Development of X-ray Methods for Studying Protein Planar Systems on a Liquid Surface Using Synchrotron Radiation.

Authors: Folomeshkin, M. S. Blagov, A. E. Boikova, A. S. et al.

Source: Crystallography Reports. Feb2023, Vol. 68 Issue 1, p97-103. 7p.

A New Method for Determining the Size of a Synchrotron Radiation Beam in the Focus of a Compound Refractive Lens.

Authors: Folomeshkin, M. S. Kohn, V. G. Seregin, A. Yu. et al.

Source: Crystallography Reports. Feb2023, Vol. 68 Issue 1, p1-6. 6p.

X-ray Diffraction Analysis of the Structure In0.53Ga0.47As Films Grown on (100) and (111)A GaAs Substrates with a Metamorphic Buffer.

Authors: Folomeshkin, M. S. Volkovsky, Yu. A. Prosekov, P. A. et al.

Source: Crystallography Reports. Jun2022, Vol. 67 Issue 3, p317-322. 6p.

Feasibility of X‐ray beam nanofocusing with compound refractive lenses.

Authors: Kohn, V. G. Folomeshkin, M. S.

Source: Journal of Synchrotron Radiation. Mar2021, Vol. 28 Issue 2, p419-428. 10p.

Refined Structure of Langmuir Lysozyme Films on Single-Crystal Silicon Wafers According to X-Ray Reflectivity Data.

Authors: Folomeshkin, M. S. Boikova, A. S. Volkovsky, Yu. A. et al.

Source: Crystallography Reports. Nov2020, Vol. 65 Issue 6, p827-831. 5p.

X-ray Diffraction Analysis and Electron Microscopy of the Carbon Fiber Structure.

Authors: Folomeshkin, M. S. Pisarevsky, Yu. V. Prosekov, P. A. et al.

Source: Crystallography Reports. Jan2019, Vol. 64 Issue 1, p1-5. 5p.

Comparative X-ray Diffractometry of the Defect Structure of ZnO Epitaxial Films Deposited by Magnetron Sputtering on C-Plane Al2O3 Substrates in Inhomogeneous Electric Field.

Authors: Volkovsky, Yu. A. Zhernova, V. A. Folomeshkin, M. S. et al.

Source: Crystallography Reports. Apr2023, Vol. 68 Issue 2, p195-202. 8p.