Search Results - "Halak, Basel"

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    Source: Benchmarking: An International Journal; 2025, Vol. 32 Issue 3, p917-942, 26p

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    Source: International Journal of Information Security; Jun2021, Vol. 20 Issue 3, p445-460, 16p

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    Source: Journal of Information Security & Applications; Mar2026, Vol. 97, pN.PAG-N.PAG, 1p

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    Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems; June 2010, Vol. 18 Issue 6, p1016-1019, 4p

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    Source: IEEE Transactions on Computers; April 2008, Vol. 57 Issue 4, p505-519, 15p

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    Source: Circuits, Systems & Signal Processing. Oct2016, Vol. 35 Issue 10, p3644-3674. 31p.

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    Source: Journal of Low Power Electronics & Applications; Sep2016, Vol. 6 Issue 3, p12, 10p

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    Source: Integration: The VLSI Journal; Sep2019, Vol. 68, p12-21, 10p

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    Source: IEEE Transactions on Circuits & Systems. Part I: Regular Papers; Oct2020, Vol. 67 Issue 10, p3309-3319, 11p

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    Source: Microelectronics Reliability; Feb2019, Vol. 93, p16-21, 6p

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    Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems; Nov2018, Vol. 26 Issue 11, p2205-2216, 12p

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    Authors: Halak, Basel1,2 (AUTHOR) bh9@ecs.soton.ac.uk

    Source: IET Circuits, Devices & Systems (Wiley-Blackwell). Jul2017, Vol. 11 Issue 4, p304-309. 6p.

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    Authors: Halak, Basel1 (AUTHOR) bh9@ecs.soton.ac.uk

    Source: IET Computers & Digital Techniques (Wiley-Blackwell). Mar2014, Vol. 8 Issue 2, p97-107. 11p.