Search Results - "Halak, Basel"
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Authors: et al.
Source: DAC: Annual ACM/IEEE Design Automation Conference; 2024, Issue 61, p283-288, 6p
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Source: Higher Education Pedagogies. 2019 4(1):197-208.
Peer Reviewed: Y
Page Count: 12
Descriptors: Engineering Education, Plagiarism, Teacher Student Relationship, Trust (Psychology), Prevention, Creative Thinking, Thinking Skills, Foreign Countries, Reputation, Universities, Writing (Composition), Computer Software, College Faculty, Teacher Attitudes, Computational Linguistics, Language Styles
Geographic Terms: United Kingdom (Southampton)
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Source: Scientific Reports. 6/9/2023, Vol. 13 Issue 1, p1-9. 9p.
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Source: Benchmarking: An International Journal; 2025, Vol. 32 Issue 3, p917-942, 26p
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Source: International Journal of Information Security; Jun2021, Vol. 20 Issue 3, p445-460, 16p
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Source: Circuits, Systems & Signal Processing. Oct2019, Vol. 38 Issue 10, p4739-4761. 23p.
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Source: Journal of Information Security & Applications; Mar2026, Vol. 97, pN.PAG-N.PAG, 1p
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Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems; June 2010, Vol. 18 Issue 6, p1016-1019, 4p
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Source: IEEE Transactions on Computers; April 2008, Vol. 57 Issue 4, p505-519, 15p
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Source: Circuits, Systems & Signal Processing. Oct2016, Vol. 35 Issue 10, p3644-3674. 31p.
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Source: Journal of Low Power Electronics & Applications; Sep2016, Vol. 6 Issue 3, p12, 10p
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Source: Journal of Circuits, Systems & Computers. 2021, Vol. 30 Issue 11, p1-37. 37p.
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Source: Integration: The VLSI Journal; Sep2019, Vol. 68, p12-21, 10p
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Source: IEEE Transactions on Circuits & Systems. Part I: Regular Papers; Oct2020, Vol. 67 Issue 10, p3309-3319, 11p
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Source: Microelectronics Reliability. Dec2017, Vol. 79, p79-90. 12p.
Subjects: Temperature, Deterioration of materials, Computer software, Instruction set architecture, Integrated circuits
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Source: Microelectronics Reliability; Feb2019, Vol. 93, p16-21, 6p
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Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems; Nov2018, Vol. 26 Issue 11, p2205-2216, 12p
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Source: Microelectronics Reliability. Dec2016, Vol. 67, p74-81. 8p.
Subjects: Integrated circuit design, Semiconductor wafer bonding, CMOS logic circuits, Integrated circuit layout, Complementary metal oxide semiconductors
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Authors: Halak, Basel1,2 (AUTHOR) bh9@ecs.soton.ac.uk
Source: IET Circuits, Devices & Systems (Wiley-Blackwell). Jul2017, Vol. 11 Issue 4, p304-309. 6p.
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Authors: Halak, Basel1 (AUTHOR) bh9@ecs.soton.ac.uk
Source: IET Computers & Digital Techniques (Wiley-Blackwell). Mar2014, Vol. 8 Issue 2, p97-107. 11p.