Search Results - "Ichimura S"
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Source: Review of Scientific Instruments; April 1990, Vol. 61, p1192-1195, 4p
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Authors: et al.
Source: Acta Physiologica. Dec2009, Vol. 197 Issue 4, p313-320. 8p. 1 Diagram, 3 Graphs.
Subjects: Oxidative stress, Oxidation-reduction reaction, Animal immobilization, Phosphocreatine, Phosphates
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Source: Vacuum; December 1998, Vol. 51 Issue 4, p695-697, 3p
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Source: Vacuum; September 1997, Vol. 48, p727-729, 3p
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Source: Vacuum; May-July 1993, Vol. 44, p657-659, 3p
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Observation of electron beam damage in thin-film SiO2 on Si with scanning Auger electron microscope.
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Source: Journal of Applied Physics; September 1979, Vol. 50, p6020-6022, 3p
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Authors: et al.
Source: International Journal of Radiation Biology. May2004, Vol. 80 Issue 5, p369-375. 7p.
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Source: Acta Neurochirurgica. Jul2008, Vol. 150 Issue 7, p637-645. 9p. 4 Color Photographs, 1 Diagram, 4 Charts.
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Source: IEEE Transactions on Applied Superconductivity; Jun2005 Part 1 of 3, Vol. 15 Issue 2, p932-935, 4p
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Source: Journal of Vacuum Science & Technology: Part B-Microelectronics Processing & Phenomena; 1985, Vol. 3 Issue 1, p232-236, 5p
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Source: Journal of Vacuum Science & Technology: Part B-Microelectronics Processing & Phenomena; 1983, Vol. 1 Issue 4, p1076-1079, 4p
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Source: Journal of Vacuum Science & Technology: Part B-Microelectronics Processing & Phenomena; 1983, Vol. 1 Issue 4, p1267-1270, 4p
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