Search Results - "Key T"

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    Diagnosing power quality-related computer problems.

    Authors: Key, T. S.

    Source: IEEE Transactions on Industry Applications; July 1979, Vol. 15, p381-393, 13p

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    Influence of OH− Ion Concentration on the Surface Morphology of ZnO-SiO2 Nanostructure.

    Authors: Tinio, Jessica Ven G. Simfroso, Key T. Peguit, Amber Dea Marie V. et al.

    Source: Journal of Nanotechnology; 10/1/2015, Vol. 2015, p1-7, 7p

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