Search Results - "Kubec, Adam"

Dual‐beam X‐ray nano‐holotomography.

Authors: Flenner, Silja Kubec, Adam David, Christian et al.

Source: Journal of Synchrotron Radiation. Jul2024, Vol. 31 Issue 4, p916-922. 7p.

Point focusing with flat and wedged crossed multilayer Laue lenses.

Authors: Kubec, Adam Melzer, Kathleen Gluch, Jürgen et al.

Source: Journal of Synchrotron Radiation. Mar2017, Vol. 24 Issue 2, p413-421. 8p.

Effect of intense x-ray free-electron laser transient gratings on the magnetic domain structure of Tm:YIG.

Authors: Ukleev, Victor Burian, Max Gliga, Sebastian et al.

Source: Journal of Applied Physics; 3/28/2023, Vol. 133 Issue 12, p1-6, 6p

Ptychography with multilayer Laue lenses.

Authors: Kubec, Adam Braun, Stefan Niese, Sven et al.

Source: Journal of Synchrotron Radiation. Sep2014, Vol. 21 Issue 5, p1122-1127. 6p.

Fabrication of customizable wedged multilayer Laue lenses by adding a stress layer.

Authors: Niese, Sven Krüger, Peter Kubec, Adam et al.

Source: Thin Solid Films; Nov2014 Part 2, Vol. 571, p321-324, 4p

Calculated Efficiencies of Three-Material Low Stress Coatings for Diffractive X-ray Transmission Optics.

Authors: Kubec, Adam Braun, Stefan Gawlitza, Peter et al.

Source: AIP Conference Proceedings. 2016, Vol. 1741 Issue 1, p1-3. 3p. 2 Graphs.

Pushing the temporal resolution in absorption and Zernike phase contrast nanotomography: enabling fast in situ experiments.

Authors: Flenner, Silja Storm, Malte Kubec, Adam et al.

Source: Journal of Synchrotron Radiation. Sep2020, Vol. 27 Issue 5, p1339-1346. 8p.

Efficiency of a multilayer-Laue-lens with a 102 µm aperture.

Authors: Macrander, Albert T. Kubec, Adam Conley, Raymond et al.

Source: Applied Physics Letters; 8/24/2015, Vol. 107 Issue 8, p1-3, 3p, 2 Diagrams, 1 Graph

Hard X-ray full-field nanoimaging using a direct photon-counting detector.

Authors: Flenner, Silja Hagemann, Johannes Wittwer, Felix et al.

Source: Journal of Synchrotron Radiation. Mar2023, Vol. 30 Issue 2, p390-399. 10p.

Multi-beam X-ray ptychography using coded probes for rapid non-destructive high resolution imaging of extended samples.

Authors: Lyubomirskiy, Mikhail Wittwer, Felix Kahnt, Maik et al.

Source: Scientific Reports. 4/13/2022, Vol. 12 Issue 1, p1-9. 9p.

Electron population dynamics in resonant non-linear x-ray absorption in nickel at a free-electron laser.

Authors: Engel, Robin Y. Alexander, Oliver Atak, Kaan et al.

Source: Structural Dynamics. Sep2023, Vol. 10 Issue 5, p1-21. 21p.

Subjects: Free electron lasers, X-ray absorption, Femtosecond pulses, Metallic thin films, Population dynamics, Lasers, Nickel

Nanobeam X-ray fluorescence and diffraction computed tomography on human bone with a resolution better than 120 nm.

Authors: Palle, Jonas Wittig, Nina Kølln Kubec, Adam et al.

Source: Journal of Structural Biology. Dec2020, Vol. 212 Issue 3, pN.PAG-N.PAG. 1p.

Subjects: Bones, X-ray fluorescence, Computed tomography, Bone mechanics, X-ray powder diffraction, X-ray diffraction, Positron emission

Gradients of microstructure, stresses and mechanical properties in a multi-layered diamond thin film revealed by correlative cross-sectional nano-analytics.

Authors: Gruber, David P. Todt, Juraj Wöhrl, Nicolas et al.

Source: Carbon. Apr2019, Vol. 144, p666-674. 9p.

A Dedicated Illumination For Full-Field X-ray Microscopy With Multilayer Laue Lenses.

Authors: Niese, Sven Braun, Stefan Dietsch, Reiner et al.

Source: AIP Conference Proceedings. 2016, Vol. 1764 Issue 1, p1-6. 6p. 1 Color Photograph, 1 Black and White Photograph, 1 Diagram, 1 Chart.

Single-shot x-ray ptychography as a structured illumination method.

Authors: Levitan A Wakonig K Gao Z et al.

Source: Optics letters [Opt Lett] 2025 Jan 15; Vol. 50 (2), pp. 443-446.

Publication Type: Journal Article

Journal Info: Publisher: Optica Publishing Group Country of Publication: United States NLM ID: 7708433 Publication Model: Print Cited Medium: Internet ISSN: 1539-4794 (Electronic) Linking ISSN: 01469592 NLM ISO Abbreviation: Opt Lett Subsets: MEDLINE; PubMed not MEDLINE

An achromatic X-ray lens.

Authors: Kubec A Zdora MC Sanli UT et al.

Source: Nature communications [Nat Commun] 2022 Mar 14; Vol. 13 (1), pp. 1305. Date of Electronic Publication: 2022 Mar 14.

Publication Type: Journal Article

Journal Info: Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101528555 Publication Model: Electronic Cited Medium: Internet ISSN: 2041-1723 (Electronic) Linking ISSN: 20411723 NLM ISO Abbreviation: Nat Commun Subsets: MEDLINE; PubMed not MEDLINE

Rapid aberration correction for diffractive X-ray optics by additive manufacturing: erratum.

Authors: Seiboth F Kubec A Schropp A et al.

Source: Optics express [Opt Express] 2024 Sep 23; Vol. 32 (20), pp. 34550.

Publication Type: Journal Article; Published Erratum

Journal Info: Publisher: Optica Publishing Group Country of Publication: United States NLM ID: 101137103 Publication Model: Print Cited Medium: Internet ISSN: 1094-4087 (Electronic) Linking ISSN: 10944087 NLM ISO Abbreviation: Opt Express Subsets: MEDLINE; PubMed not MEDLINE

Multilayer Laue Lenses (MLL) with 45 mm Focal Length as Optics for In-situ Nanoindentation Experiments.

Authors: Kubec, Adam Niese, Sven Gluch, Jurgen et al.

Source: Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 2018 Supplement2; Vol. 24.

Journal Info: Publisher: Oxford University Press / USA ISSN: 1431-9276

Slope error correction on X-ray reflection gratings by a variation of the local line density.

Authors: Kubec A Samadi N Langer M et al.

Source: Optics express [Opt Express] 2022 Dec 19; Vol. 30 (26), pp. 46248-46258.

Publication Type: Journal Article

Journal Info: Publisher: Optica Publishing Group Country of Publication: United States NLM ID: 101137103 Publication Model: Print Cited Medium: Internet ISSN: 1094-4087 (Electronic) Linking ISSN: 10944087 NLM ISO Abbreviation: Opt Express Subsets: MEDLINE; PubMed not MEDLINE

Rapid aberration correction for diffractive X-ray optics by additive manufacturing.

Authors: Seiboth F Kubec A Schropp A et al.

Source: Optics express [Opt Express] 2022 Aug 29; Vol. 30 (18), pp. 31519-31529.

Publication Type: Journal Article

Journal Info: Publisher: Optica Publishing Group Country of Publication: United States NLM ID: 101137103 Publication Model: Print Cited Medium: Internet ISSN: 1094-4087 (Electronic) Linking ISSN: 10944087 NLM ISO Abbreviation: Opt Express Subsets: MEDLINE; PubMed not MEDLINE