Search Results - "Kubec, Adam"

Dual‐beam X‐ray nano‐holotomography.

Authors: Flenner, Silja Kubec, Adam David, Christian et al.

Source: Journal of Synchrotron Radiation. Jul2024, Vol. 31 Issue 4, p916-922. 7p.

Pushing the temporal resolution in absorption and Zernike phase contrast nanotomography: enabling fast in situ experiments.

Authors: Flenner, Silja Storm, Malte Kubec, Adam et al.

Source: Journal of Synchrotron Radiation. Sep2020, Vol. 27 Issue 5, p1339-1346. 8p.

Effect of intense x-ray free-electron laser transient gratings on the magnetic domain structure of Tm:YIG.

Authors: Ukleev, Victor Burian, Max Gliga, Sebastian et al.

Source: Journal of Applied Physics; 3/28/2023, Vol. 133 Issue 12, p1-6, 6p

Point focusing with flat and wedged crossed multilayer Laue lenses.

Authors: Kubec, Adam Melzer, Kathleen Gluch, Jürgen et al.

Source: Journal of Synchrotron Radiation. Mar2017, Vol. 24 Issue 2, p413-421. 8p.

Multi-beam X-ray ptychography using coded probes for rapid non-destructive high resolution imaging of extended samples.

Authors: Lyubomirskiy, Mikhail Wittwer, Felix Kahnt, Maik et al.

Source: Scientific Reports. 4/13/2022, Vol. 12 Issue 1, p1-9. 9p.

Hard X-ray full-field nanoimaging using a direct photon-counting detector.

Authors: Flenner, Silja Hagemann, Johannes Wittwer, Felix et al.

Source: Journal of Synchrotron Radiation. Mar2023, Vol. 30 Issue 2, p390-399. 10p.

Multilayer Laue Lenses (MLL) with 45 mm Focal Length as Optics for In-situ Nanoindentation Experiments.

Authors: Kubec, Adam Niese, Sven Gluch, Jurgen et al.

Source: Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 2018 Supplement2; Vol. 24.

Journal Info: Publisher: Oxford University Press / USA ISSN: 1431-9276