Search Results - "Lin, Chao-Cheng"
-
1
Authors:
Source: Taiwanese Journal of Psychiatry. Oct-Dec2025, Vol. 39 Issue 4, p228-237. 10p.
HTML Full Text PDF Full Text -
2
Authors:
Source: Taiwanese Journal of Psychiatry. Oct-Dec2024, Vol. 38 Issue 4, p161-170. 10p.
HTML Full Text PDF Full Text -
3
Authors:
Source: Taiwanese Journal of Psychiatry. Jul-Sep2024, Vol. 38 Issue 3, p153-155. 3p.
HTML Full Text PDF Full Text -
4
Authors: et al.
Source: Journal of Applied Physics; 2/14/2024, Vol. 135 Issue 6, p1-6, 6p
-
5
Authors: et al.
Source: Applied Sciences (2076-3417); Apr2019, Vol. 9 Issue 7, p1432, 8p
HTML Full Text PDF Full Text -
6
Authors:
Source: Journal of Physics: D Applied Physics; February 24 2010, Vol. 43 Issue 7, p075106-1-075106-4, 4p
-
7
Authors:
Source: Journal of the Electrochemical Society; 2009, Vol. 156 Issue 4, pH276-H280, 5p
-
8
Authors:
Source: Journal of the Electrochemical Society; 2009, Vol. 156 Issue 9, pH716-H719, 4p
-
9
Authors: et al.
Source: Cognitive Neuropsychiatry. Jul2017, Vol. 22 Issue 4, p331-345. 15p. 4 Charts, 2 Graphs.
Subjects: Facial expression & emotions (Psychology), Social anxiety, Emotion recognition, Self-expression, Mental depression
HTML Full Text PDF Full Text -
10
Authors: et al.
Source: Advanced Electronic Materials; Apr2023, Vol. 9 Issue 4, p1-6, 6p
-
11
Authors:
Source: Suicide & Life-Threatening Behavior. Dec2022, Vol. 52 Issue 6, p1193-1204. 12p. 2 Diagrams, 5 Charts.
Subject Terms: *Undergraduates, Suicidal ideation, Suicide, Internet surveys, Panel analysis
-
12
Authors:
Source: Journal of the Electrochemical Society; September 2011, Vol. 158 Issue 9, pH876-H878, 3p
-
13
Authors:
Source: IEEE Electron Device Letters; September 2006, Vol. 27 Issue 9, p725-727, 3p
-
14
Authors: et al.
Source: International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics. 5/30/2021, Vol. 35 Issue 14-16, p1-5. 5p.
-
15
Authors: et al.
Source: Acta Psychiatrica Scandinavica. Nov2000, Vol. 102 Issue 5, p350-353. 4p.
PDF Full Text -
16
Authors: et al.
Source: Applied Physics Letters; 5/26/2020, Vol. 116 Issue 21, p1-5, 5p, 1 Diagram, 1 Chart, 3 Graphs
-
17
Authors: et al.
Source: IEEE Transactions on Electron Devices; Jan2020, Vol. 67 Issue 1, p113-117, 5p
-
18
Authors: et al.
Source: IEEE Electron Device Letters; Jul2018, Vol. 39 Issue 7, p983-986, 4p
-
19
Authors: et al.
Source: Public Health Nutrition. Dec2017, Vol. 20 Issue 17, p3151-3155. 5p.
-
20
Authors: et al.
Source: Scientific Reports. 8/27/2019, Vol. 9 Issue 1, pN.PAG-N.PAG. 1p.
HTML Full Text PDF Full Text