Search Results - "McCurdy, M."

Similarity to the self influences memory for social targets.

Authors: Sklenar, A. M. Pérez, J. McCurdy, M. P. et al.

Source: Cognition & Emotion. May/Jun2023, Vol. 37 Issue 4, p595-616. 22p. 1 Diagram, 6 Charts, 4 Graphs.

Subjects: Collective memory, Social influence, Self, Similarity (Psychology), Memory testing, Political doctrines, Impression formation (Psychology)

Executive Functions among Youth with Down Syndrome and Co-Existing Neurobehavioural Disorders

Authors: Pritchard, A. E. Kalback, S. McCurdy, M.

Source: Journal of Intellectual Disability Research. Dec 2015 59(12):1130-1141.

Peer Reviewed: Y

Page Count: 12

Descriptors: Executive Function, Down Syndrome, Neurological Impairments, Behavior Problems, Comorbidity, Behavior Rating Scales, Psychometrics, Autism, Pervasive Developmental Disorders, Factor Analysis, Metacognition, Inhibition, Intellectual Disability

Single-event burnout in homojunction GaN vertical PiN diodes with hybrid edge termination design.

Authors: Senarath, A. S. Islam, S. Sengupta, A. et al.

Source: Applied Physics Letters; 3/25/2024, Vol. 124 Issue 13, p1-7, 7p

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The origin and identification of macropores in an earthen-lined dairy manure storage basin.

Authors: McCurdy, M. McSweeney, K.

Source: Journal of Environmental Quality; January/March 1993, Vol. 22, p149-154, 6p

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Test-retest reliability of the Capute scales for neurodevelopmental screening of a high risk sample: Impact of test-retest interval and degree of neonatal risk.

Authors: McCurdy, M. Bellows, A. Deng, D. et al.

Source: Journal of Neonatal - Perinatal Medicine. 2015, Vol. 8 Issue 3, p233-241. 9p. 2 Illustrations, 2 Charts.

Optimization of Kiln Drying for Softwood through Simulation of Wood Stack Drying, Energy Use, and Wood Color Change.

Authors: McCurdy, M. C. Pang, S.

Source: Drying Technology. Oct2007, Vol. 25 Issue 10, p1733-1740. 8p. 2 Diagrams, 3 Charts, 6 Graphs.

Quantum cascade laser-based integrated cavity output spectroscopy of exhaled nitric oxide.

Authors: McCurdy, M. R. Bakhirkin, Y. A. Tittel, F. K.

Source: Applied Physics B: Lasers & Optics. Nov2006, Vol. 11 Issue 2/3, p445-452. 8p. 2 Diagrams, 7 Graphs.

SURFACE COLOUR CHANGE IN WOOD DURING DRYING ABOVE AND BELOW FIBRE SATURATION POINT.

Authors: McCurdy, M. C. Pang, S. Keey, R. B.

Source: Maderas: Ciencia y Tecnología. 2006, Vol. 8 Issue 1, p31-40. 10p.

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Comparison of Total-Ionizing-Dose Effects in Bulk and SOI FinFETs at 90 and 295 K.

Authors: Haeffner, T. D. Keller, R. F. Jiang, R. et al.

Source: IEEE Transactions on Nuclear Science; Jun2019, Vol. 66 Issue 6, p911-917, 7p

Low-frequency noise and defects in copper and ruthenium resistors.

Authors: Fleetwood, D. M. Beyne, S. Jiang, R. et al.

Source: Applied Physics Letters; 2019, Vol. 114 Issue 20, pN.PAG-N.PAG, 5p, 1 Chart, 2 Graphs

Ionizing Radiation Effects Spectroscopy for Analysis of Total-Ionizing Dose Degradation in RF Circuits.

Authors: Patel, B. Joplin, M. Boggs, R. C. et al.

Source: IEEE Transactions on Nuclear Science; Jan2019, Vol. 66 Issue 1, p61-68, 8p

X-Ray and Proton Radiation Effects on 40 nm CMOS Physically Unclonable Function Devices.

Authors: Wang, P. F. Zhang, E. X. Chuang, K. H. et al.

Source: IEEE Transactions on Nuclear Science; Aug2018, Vol. 65 Issue 8, p1519-1524, 6p

New Insights Gained on Mechanisms of Low-Energy Proton-Induced SEUs by Minimizing Energy Straggle.

Authors: Dodds, N. A. Dodd, P. E. Shaneyfelt, M. R. et al.

Source: IEEE Transactions on Nuclear Science; Dec2015 Part 1, Vol. 62 Issue 6a, p2822-2829, 8p

Multi-Cell Soft Errors at Advanced Technology Nodes.

Authors: Bhuva, B. L. Tam, N. Massengill, L. W. et al.

Source: IEEE Transactions on Nuclear Science; Dec2015 Part 1, Vol. 62 Issue 6a, p2585-2591, 7p

The Impact of X-Ray and Proton Irradiation on HfO_2/Hf-Based Bipolar Resistive Memories.

Authors: Bi, J. S. Han, Z. S. Zhang, E. X. et al.

Source: IEEE Transactions on Nuclear Science; Dec2013 Part 1, Vol. 60 Issue 6, p4540-4546, 7p