Search Results - "Muhammad, Inam"
-
1
This result is not displayed to guests.
Login for full access. -
2
Authors: et al.
Source: Journal of Engineering (2314-4912). 11/3/2025, Vol. 2025, p1-7. 7p.
Subjects: Dielectric properties, Machine learning, Microwaves, Substrates (Materials science), Electromagnetic measurements, Computational electromagnetics, Waveguides, Dielectrics
HTML Full Text PDF Full Text -
3
-
4
This result is not displayed to guests.
Login for full access. -
5
Authors: et al.
Source: International Journal of Antennas & Propagation; 12/27/2024, Vol. 2024, p1-15, 15p
HTML Full Text PDF Full Text -
6
Authors: et al.
Source: International Journal of Antennas & Propagation; 12/7/2024, Vol. 2024, p1-14, 14p
HTML Full Text PDF Full Text -
7
-
8
This result is not displayed to guests.
Login for full access. -
9
Authors: et al.
Source: Scientific Reports. 3/7/2026, Vol. 16 Issue 1, p1-12. 12p.
HTML Full Text PDF Full Text -
10
-
11
Authors: et al.
Source: Journal of Health Sciences (Qassim University). May/Jun2026, Vol. 20 Issue 3, p143-152. 10p.
PDF Full Text -
12
Authors:
Source: Journal of Engineering (2314-4912). 3/13/2026, Vol. 2026, p1-12. 12p.
Subjects: Electric capacity, Electric inductance, Electric impedance, Dielectric relaxation, Body composition, Bioelectric impedance, Simulation Program with Integrated Circuit Emphasis
HTML Full Text PDF Full Text -
13
Authors: et al.
Source: Multimedia Tools & Applications; Feb2023, Vol. 82 Issue 5, p7841-7859, 19p
HTML Full Text PDF Full Text -
14
Authors: et al.
Source: Journal of Polymer Materials. 2025, Vol. 42 Issue 1, p141-150. 10p.
HTML Full Text PDF Full Text -
15
Authors: et al.
Source: Advanced Science. 11/6/2024, Vol. 11 Issue 41, p1-15. 15p.
HTML Full Text PDF Full Text -
16
-
17
-
18
Authors: et al.
Source: Security & Communication Networks; 9/29/2022, p1-13, 13p
HTML Full Text PDF Full Text -
19
Authors: et al.
Source: Small Science. Apr2026, Vol. 6 Issue 4, p1-15. 15p.
HTML Full Text PDF Full Text -
20
Authors: et al.
Source: Journal of Materials Science: Materials in Electronics; Feb2022, Vol. 33 Issue 4, p2222-2233, 12p
HTML Full Text PDF Full Text