Search Results - "Optical quality control"

Product Design Enhancement With Test Structures for Non-Contact Detection of Yield Detractors.

Authors: Brozek, Tomasz Lam, Stephen Hess, Christopher et al.

Source: IEEE Transactions on Semiconductor Manufacturing; May2025, Vol. 38 Issue 2, p126-133, 8p

Customized eye modeling for optical quality assessment in myopic femto-LASIK surgery.

Authors: Lan, Gongpu Zeng, Jun Li, Wenjie et al.

Source: Scientific Reports. 8/6/2021, Vol. 11 Issue 1, p1-11. 11p.

CAD Layout Analysis for Defect Inspection in Semiconductor Fabrication.

Authors: Vikram, Abhishek Agarwal, Vineeta Agarwal, Anshul

Source: IETE Journal of Research; Sep-Oct2020, Vol. 66 Issue 5, p677-684, 8p

Development of a Reflective 193-nm DUV Microscope System for Defect Inspection of Large Optical Surfaces.

Authors: Kim, Hong-Seung Lee, Dong-Ho Hyun, Sangwon et al.

Source: Applied Sciences (2076-3417); Dec2019, Vol. 9 Issue 23, p5205, 9p

High-resolution optical inspection system for fast detection and classification of surface defects.

Authors: Ye, Ruifang Chang, Ming Pan, Chia-Sheng et al.

Source: International Journal of Optomechatronics. Dec2018, Vol. 12 Issue 1, p1-10. 10p.

Subjects: Optical quality control, Surface defects, Parallel computers, Image processing, Iterative methods (Mathematics)

A simple graphical method to pinpoint local pseudosymmetries in Z′ > 1 cases.

Authors: Baggio, Ricardo¹ (AUTHOR) baggio@tandar.cnea.gov.ar

Source: Acta Crystallographica Section C: Structural Chemistry. Jul2019, Vol. 75 Issue 7, p837-850. 14p.

Peculiarities of growing InGaAs/GaAs/AlGaAs laser structures by MOCVD on Ge/Si substrates.

Authors: Baidus, N. Aleshkin, V. Dubinov, A. et al.

Source: Semiconductors. Nov2017, Vol. 51 Issue 11, p1527-1530. 4p.

Subjects: Gallium arsenide transistors, Optical quality control, Engineering inspection, Optical measurements, Quantum wells

Synthesis, Growth and Characterization of L-Glycine Glycinium Hydrochloride Monohydrate Crystals: A New Nonlinear Optical Material.

Authors: Sudhakar, C. Jothi, L.

Source: Journal of Molecular & Engineering Materials; Sep-Dec2023, Vol. 11 Issue 3/4, p1-9, 9p

Evaluation of Optical Quality: Ocular Scattering and Aberrations in Eyes Implanted with Diffractive Multifocal or Monofocal Intraocular Lenses.

Authors: Liao, Xuan Lin, Jia Tian, Jing et al.

Source: Current Eye Research. Jun2018, Vol. 43 Issue 6, p696-701. 6p.

A Review of Speckle Pattern Fabrication and Assessment for Digital Image Correlation.

Authors: Dong, Y.L. Pan, B.

Source: Experimental Mechanics; Oct2017, Vol. 57 Issue 8, p1161-1181, 21p

Development of an optical inspection platform for surface defect detection in touch panel glass.

Authors: Chang, Ming Chen, Bo-Cheng Gabayno, Jacque Lynn et al.

Source: International Journal of Optomechatronics. 2016, Vol. 10 Issue 2, p63-72. 10p.

Subjects: Optical quality control, Surface defects, Touch screens, High resolution imaging, Image analysis, Image processing

A novel defect detection and identification method in optical inspection.

Authors: Xie, Liangjun Huang, Rui Gu, Nong et al.

Source: Neural Computing & Applications. Jun2014, Vol. 24 Issue 7/8, p1953-1962. 10p.

Subjects: Optical quality control, Point defects, Semiconductor industry, Pattern recognition systems, Support vector machines, Image processing

Design Considerations for Scalable High-Performance Vision Systems Embedded in Industrial Print Inspection Machines.

Authors: Fürtler, Johannes Rössler, Peter Brodersen, Jörg et al.

Source: EURASIP Journal on Embedded Systems. 2007 Special Issue 2, p1-10. 10p. 8 Diagrams, 2 Charts.

Subjects: Embedded computer systems, Optical quality control, Field programmable gate arrays, Signal processing, Algorithms

Influence of pyrolytic temperature on the properties of ZnO films optimized for H sensing application.

Authors: Vijayalakshmi, K. Gopalakrishna, D.

Source: Journal of Materials Science: Materials in Electronics. May2014, Vol. 25 Issue 5, p2253-2260. 8p.

Subjects: Photoluminescence, Optical quality control, Hydrogen, Ohmic contacts, Substrates (Materials science)

In situ optical inspection of electrochemical migration during THB tests.

Authors: Medgyes, Bálint Illés, Balázs Berényi, Richárd et al.

Source: Journal of Materials Science: Materials in Electronics. Jun2011, Vol. 22 Issue 6, p694-700. 7p.

Subjects: Optical quality control, Condensation, Dendritic crystals, Water immersion, Silver, Copper, Dew point, Electric insulators & insulation

Defect detection in periodic patterns using a multi-band-pass filter.

Authors: Tsai, Zong-Da Perng, Ming-Hwei

Source: Machine Vision & Applications. Apr2013, Vol. 24 Issue 3, p551-565. 15p. 8 Black and White Photographs, 1 Diagram, 7 Charts, 1 Graph.

Subjects: Image processing, Optical quality control, Automation, Mathematical convolutions, Filters (Mathematics)

Morphology of {100} and {201} faces and the optical quality of KTiOPO4 crystals.

Authors: Yakobson, V. Voĭtsekhovskiĭ, V.

Source: Crystallography Reports. Jul2009, Vol. 54 Issue 4, p675-682. 8p. 2 Black and White Photographs, 9 Diagrams.

Subjects: Morphology, Optical quality control, Potassium, Phosphates, Crystals

Evaluation of a Cleaning Procedure for Micro-Structured Devices by Optical Inspection.

Authors: Schoenitz, M. Warmeling, N. Augustin, W. et al.

Source: Experimental Heat Transfer. Jul2014, Vol. 27 Issue 4, p376-388. 13p.

Subjects: Microstructure, Optical quality control, Fouling, Measurement of pressure drop (Fluid dynamics), MatLab (Computer software), Heat exchangers

Advanced automated optical inspection system for fishtail collapse of microrouter.

Authors: Perng, Der-Baau Chen, Yen-Chung

Source: Nondestructive Testing & Evaluation. Dec2008, Vol. 23 Issue 4, p257-272. 16p. 9 Color Photographs, 1 Black and White Photograph, 12 Diagrams, 1 Chart, 2 Graphs.

Subjects: Optical quality control, Printed circuits, Light emitting diodes, Blades (Hydraulic machinery), Quality control

Off-line inspections under inspection errors.

Authors: Tzimerman, Avinoam Herer, YaleT.

Source: IIE Transactions. Jul2009, Vol. 41 Issue 7, p626-641. 16p.

Subjects: Engineering inspection, Optical quality control, Dynamic programming, Systems engineering, Quality control, Operations research, Mathematical optimization