Search Results - "Own CS"

Fast imaging of millimeter-scale areas with beam deflection transmission electron microscopy.

Authors: Zheng Z Own CS Wanner AA et al.

Source: Nature communications [Nat Commun] 2024 Aug 10; Vol. 15 (1), pp. 6860. Date of Electronic Publication: 2024 Aug 10.

Publication Type: Journal Article

Journal Info: Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101528555 Publication Model: Electronic Cited Medium: Internet ISSN: 2041-1723 (Electronic) Linking ISSN: 20411723 NLM ISO Abbreviation: Nat Commun Subsets: MEDLINE; PubMed not MEDLINE

A petascale automated imaging pipeline for mapping neuronal circuits with high-throughput transmission electron microscopy.

Authors: Yin W Brittain D Borseth J et al.

Source: Nature communications [Nat Commun] 2020 Oct 02; Vol. 11 (1), pp. 4949. Date of Electronic Publication: 2020 Oct 02.

Publication Type: Journal Article; Research Support, N.I.H., Extramural; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S.

Journal Info: Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101528555 Publication Model: Electronic Cited Medium: Internet ISSN: 2041-1723 (Electronic) Linking ISSN: 20411723 NLM ISO Abbreviation: Nat Commun Subsets: MEDLINE

Multi-order Scaling of High-throughput Transmission Electron Microscopy.

Authors: Own CS DeRego T Own LS et al.

Source: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2019 Aug; Vol. 25 (Suppl 2), pp. 1040-1041. Date of Electronic Publication: 2019 Aug 05.

Publication Type: Journal Article

Journal Info: Publisher: Oxford University Press Country of Publication: England NLM ID: 9712707 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1435-8115 (Electronic) Linking ISSN: 14319276 NLM ISO Abbreviation: Microsc Microanal Subsets: MEDLINE; PubMed not MEDLINE

Molecular threading: mechanical extraction, stretching and placement of DNA molecules from a liquid-air interface.

Authors: Payne AC Andregg M Kemmish K et al.

Source: PloS one [PLoS One] 2013 Jul 31; Vol. 8 (7), pp. e69058. Date of Electronic Publication: 2013 Jul 31 (Print Publication: 2013).

Publication Type: Journal Article; Research Support, N.I.H., Extramural; Research Support, U.S. Gov't, Non-P.H.S.

Journal Info: Publisher: Public Library of Science Country of Publication: United States NLM ID: 101285081 Publication Model: Electronic-Print Cited Medium: Internet ISSN: 1932-6203 (Electronic) Linking ISSN: 19326203 NLM ISO Abbreviation: PLoS One Subsets: MEDLINE

Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy.

Authors: Krivanek OL Chisholm MF Nicolosi V et al.

Source: Nature [Nature] 2010 Mar 25; Vol. 464 (7288), pp. 571-4.

Publication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S.

Journal Info: Publisher: Nature Publishing Group Country of Publication: England NLM ID: 0410462 Publication Model: Print Cited Medium: Internet ISSN: 1476-4687 (Electronic) Linking ISSN: 00280836 NLM ISO Abbreviation: Nature Subsets: MEDLINE

Aberration-Corrected STEM.

Authors: Bacon, NJ Corbin, GJ Dellby, N et al.

Source: Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada Jul2009 Supplement 2; Vol. 15 (S2).

Journal Info: Publisher: Oxford University Press / USA ISSN: 1431-9276

Aberration-corrected Precession Electron Diffraction.

Authors: Own, CS Dellby, N Krivanek, O et al.

Source: Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada Aug2007 Supplement; Vol. 13 (S02).

Journal Info: Publisher: Oxford University Press / USA ISSN: 1431-9276

High-stability, Highly Automated Double-eucentric (S)TEM Sample Stage.

Authors: Own, CS Corbin, GJ Dellby, N et al.

Source: Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada Aug2006 Supplement; Vol. 12 (S02).

Journal Info: Publisher: Oxford University Press / USA ISSN: 1431-9276

Quantitative analyses of precession diffraction data for a large cell oxide.

Authors: Own CS Subramanian AK Marks LD

Source: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2004 Feb; Vol. 10 (1), pp. 96-104.

Publication Type: Journal Article

Journal Info: Publisher: Oxford University Press Country of Publication: England NLM ID: 9712707 Publication Model: Print Cited Medium: Print ISSN: 1431-9276 (Print) Linking ISSN: 14319276 NLM ISO Abbreviation: Microsc Microanal Subsets: MEDLINE

High-energy-resolution monochromator for aberration-corrected scanning transmission electron microscopy/electron energy-loss spectroscopy.

Authors: Krivanek OL Ursin JP Bacon NJ et al.

Source: Philosophical transactions. Series A, Mathematical, physical, and engineering sciences [Philos Trans A Math Phys Eng Sci] 2009 Sep 28; Vol. 367 (1903), pp. 3683-97.

Publication Type: Journal Article

Journal Info: Publisher: The Royal Society Country of Publication: England NLM ID: 101133385 Publication Model: Print Cited Medium: Print ISSN: 1364-503X (Print) Linking ISSN: 1364503X NLM ISO Abbreviation: Philos Trans A Math Phys Eng Sci Subsets: PubMed not MEDLINE

A quantitative analysis of the cone-angle dependence in precession electron diffraction.

Authors: Ciston J Deng B Marks LD et al.

Source: Ultramicroscopy [Ultramicroscopy] 2008 May; Vol. 108 (6), pp. 514-22. Date of Electronic Publication: 2007 Aug 08.

Publication Type: Journal Article

Journal Info: Publisher: Elsevier Country of Publication: Netherlands NLM ID: 7513702 Publication Model: Print-Electronic Cited Medium: Print ISSN: 0304-3991 (Print) Linking ISSN: 03043991 NLM ISO Abbreviation: Ultramicroscopy Subsets: PubMed not MEDLINE

An electron microscope for the aberration-corrected era.

Authors: Krivanek OL Corbin GJ Dellby N et al.

Source: Ultramicroscopy [Ultramicroscopy] 2008 Feb; Vol. 108 (3), pp. 179-95. Date of Electronic Publication: 2007 Oct 22.

Publication Type: Journal Article

Journal Info: Publisher: Elsevier Country of Publication: Netherlands NLM ID: 7513702 Publication Model: Print-Electronic Cited Medium: Print ISSN: 0304-3991 (Print) Linking ISSN: 03043991 NLM ISO Abbreviation: Ultramicroscopy Subsets: PubMed not MEDLINE

Application of a 2-beam model for improving the structure factors from precession electron diffraction intensities.

Authors: Sinkler W Own CS Marks LD

Source: Ultramicroscopy [Ultramicroscopy] 2007 Jun-Jul; Vol. 107 (6-7), pp. 543-50. Date of Electronic Publication: 2006 Dec 20.

Publication Type: Journal Article

Journal Info: Publisher: Elsevier Country of Publication: Netherlands NLM ID: 7513702 Publication Model: Print-Electronic Cited Medium: Print ISSN: 0304-3991 (Print) Linking ISSN: 03043991 NLM ISO Abbreviation: Ultramicroscopy Subsets: PubMed not MEDLINE

Prospects for aberration corrected electron precession.

Authors: Own CS Sinkler W Marks LD

Source: Ultramicroscopy [Ultramicroscopy] 2007 Jun-Jul; Vol. 107 (6-7), pp. 534-42. Date of Electronic Publication: 2006 Dec 12.

Publication Type: Journal Article

Journal Info: Publisher: Elsevier Country of Publication: Netherlands NLM ID: 7513702 Publication Model: Print-Electronic Cited Medium: Print ISSN: 0304-3991 (Print) Linking ISSN: 03043991 NLM ISO Abbreviation: Ultramicroscopy Subsets: PubMed not MEDLINE

Precession electron diffraction 1: multislice simulation.

Authors: Own CS Marks LD Sinkler W

Source: Acta crystallographica. Section A, Foundations of crystallography [Acta Crystallogr A] 2006 Nov; Vol. 62 (Pt 6), pp. 434-43. Date of Electronic Publication: 2006 Oct 21.

Publication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S.

Journal Info: Publisher: Wiley-Blackwell Pub Country of Publication: United States NLM ID: 8305825 Publication Model: Print-Electronic Cited Medium: Print ISSN: 0108-7673 (Print) Linking ISSN: 01087673 NLM ISO Abbreviation: Acta Crystallogr A Subsets: MEDLINE

Rapid structure determination of a metal oxide from pseudo-kinematical electron diffraction data.

Authors: Own CS Sinkler W Marks LD

Source: Ultramicroscopy [Ultramicroscopy] 2006 Jan; Vol. 106 (2), pp. 114-22. Date of Electronic Publication: 2005 Jul 28.

Publication Type: Journal Article

Journal Info: Publisher: Elsevier Country of Publication: Netherlands NLM ID: 7513702 Publication Model: Print-Electronic Cited Medium: Print ISSN: 0304-3991 (Print) Linking ISSN: 03043991 NLM ISO Abbreviation: Ultramicroscopy Subsets: PubMed not MEDLINE

Solution-phase, triangular ag nanotriangles fabricated by nanosphere lithography.

Authors: Haes AJ Zhao J Zou S et al.

Source: The journal of physical chemistry. B [J Phys Chem B] 2005 Jun 09; Vol. 109 (22), pp. 11158-62.

Publication Type: Journal Article

Journal Info: Publisher: American Chemical Society Country of Publication: United States NLM ID: 101157530 Publication Model: Print Cited Medium: Print ISSN: 1520-6106 (Print) Linking ISSN: 15205207 NLM ISO Abbreviation: J Phys Chem B Subsets: PubMed not MEDLINE

EDM 1.0: electron direct methods.

Authors: Kilaas R Marks LD Own CS

Source: Ultramicroscopy [Ultramicroscopy] 2005 Feb; Vol. 102 (3), pp. 233-7.

Publication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S.

Journal Info: Publisher: Elsevier Country of Publication: Netherlands NLM ID: 7513702 Publication Model: Print Cited Medium: Print ISSN: 0304-3991 (Print) Linking ISSN: 03043991 NLM ISO Abbreviation: Ultramicroscopy Subsets: MEDLINE