Search Results - "RAMPRASATH, S."
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Source: Journal of Power Electronics; Nov2024, Vol. 24 Issue 11, p1843-1854, 12p
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Source: ITM Web of Conferences; 11/10/2023, Vol. 57, p1-10, 10p
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Source: Reliability: Theory & Applications. Sep2025, Vol. 20 Issue 3, p78-89. 12p.
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Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. May2014, Vol. 33 Issue 5, p717-727. 11p.
Subjects: Integrated circuits, Delay lines, Critical path analysis, Algorithms, Mathematical programming
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Source: Scientific reports [Sci Rep] 2025 Dec 07; Vol. 15 (1), pp. 43604. Date of Electronic Publication: 2025 Dec 07.
Publication Type: Journal Article
Journal Info: Publisher: Nature Publishing Group Country of Publication: England NLM ID: 101563288 Publication Model: Electronic Cited Medium: Internet ISSN: 2045-2322 (Electronic) Linking ISSN: 20452322 NLM ISO Abbreviation: Sci Rep Subsets: MEDLINE; PubMed not MEDLINE