Search Results - "Reflection high energy electron diffraction"

RHEED pattern classification by a convolutional neural network for the growth of chalcogenide thin films and nanostructures.

Authors: Muetzel, Nathan Luu, Viet Bey, Sara et al.

Source: AIP Advances. Mar2026, Vol. 16 Issue 3, p1-7. 7p.

Improvement of data analytics techniques in reflection high-energy electron diffraction to enable machine learning.

Authors: Gemperline, Patrick T. Paudel, Rajendra Vasudevan, Rama K. et al.

Source: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films. May2025, Vol. 43 Issue 3, p1-8. 8p.

Subjects: Reflection high energy electron diffraction, Machine learning, Perovskite analysis, K-means clustering, Data analytics, Molecular beam epitaxy, Real-time computing, Principal components analysis

Droplet epitaxy of InGaN quantum dots on Si (111) by plasma-assisted molecular beam epitaxy.

Authors: Nurzal, Nurzal Hsu, Ting-Yu Susanto, Iwan et al.

Source: Discover Nano; 4/7/2023, Vol. 18 Issue 1, p1-10, 10p

Real‐Time Self‐Optimization of Quantum Dot Laser Emissions During Machine Learning‐Assisted Epitaxy.

Authors: Shen, Chao Zhan, Wenkang Pan, Shujie et al.

Source: Advanced Science; 7/17/2025, Vol. 12 Issue 27, p1-13, 13p

Machine-learning-enabled on-the-fly analysis of RHEED patterns during thin film deposition by molecular beam epitaxy.

Authors: Kaspar, Tiffany C. Akers, Sarah Sprueill, Henry W. et al.

Source: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; May2025, Vol. 43 Issue 3, p1-15, 15p

Heteroepitaxy of MOCVD grown MoS2 and WS2 multilayers on AlN(0001)/sapphire(0001) characterized by azimuthal RHEED.

Authors: Kumari, Shalini Lin, Weichang Dhull, Neha et al.

Source: Physica E. Jul2026, Vol. 182, pN.PAG-N.PAG. 1p.

Subjects: Reflection high energy electron diffraction, Molybdenum disulfide, Aluminum nitride, Epitaxy, Sulfides, Metal organic chemical vapor deposition, Transition metal chalcogenides, Substrates (Materials science)

Terahertz emission increase in GaAs films exhibiting structural defects grown on Si (100) substrates using a two-layered LTG-GaAs buffer system.

Authors: Gonzales, Karl Cedric Prieto, Elizabeth Ann Catindig, Gerald Angelo et al.

Source: Journal of Materials Science: Materials in Electronics. May2021, Vol. 32 Issue 10, p13825-13836. 12p.

Subjects: Molecular beam epitaxy, Reflection high energy electron diffraction, Auditing standards, Antiphase boundaries

RHEED investigation of the self-assembly of InAs quantum dots on AlGaAs.

Authors: Espinosa-Vega, L.I. Yépez-Barradas, G. Cortés-Mestizo, I.E et al.

Source: Journal of Crystal Growth. Sep2026, Vol. 690, pN.PAG-N.PAG. 1p.

Subjects: Reflection high energy electron diffraction, Nucleation, Nanofabrication, Quantum dots, Diffusion kinetics, Ternary alloys, Molecular beam epitaxy

Design of an atomic layer deposition system with in situ reflection high energy electron diffraction.

Authors: Howzen, Alexandra J. Caspar, Justin Oztekin, Alparslan et al.

Source: Review of Scientific Instruments; Nov2024, Vol. 95 Issue 11, p1-11, 11p

Molecular Beam Epitaxy Growth of GaN/InGaN Heterostructures under In‐Bilayer Stabilized Conditions.

Authors: Malindretos, Joerg Jaeckel, Hendrik Hilbrunner, Constantin et al.

Source: Physica Status Solidi (B). Nov2024, Vol. 261 Issue 11, p1-6. 6p.

A Python package for simulations of RHEED intensity oscillations within the kinematical approximation.

Authors: Daniluk, Bartłomiej Daniluk, Andrzej Wójcik, Grzegorz M.

Source: Computer Physics Communications. Aug2026, Vol. 325, pN.PAG-N.PAG. 1p.

Subjects: Reflection high energy electron diffraction, Thin film deposition, Software engineering, Python programming language, Approximation error, Nonlinear differential equations, Simulation software

Molecular beam epitaxy and crystal structure of majority a-plane-oriented and substrate-strained Mn3Sn thin films grown directly on sapphire (0001).

Authors: Upadhyay, Sneha Erickson, Tyler Hall, Hannah et al.

Source: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films. Jul2023, Vol. 41 Issue 4, p1-11. 11p.

Subjects: Molecular beam epitaxy, Reflection high energy electron diffraction, Thin films, Gallium nitride films, Scanning transmission electron microscopy, Crystal structure, Electron diffraction

MnSe -- Molecular Beam Epitaxy Growth and Optical Characterisation.

Authors: KUCHAREK, J. BOŻEK, R. PACUSKI, W.

Source: Acta Physica Polonica: A. Oct2019, Vol. 136 Issue 4, p598-602. 5p.

Bismuth films deposited by molecular beam epitaxy.

Authors: Bárta, Tomáš Novák, Petr Nedvědová, Lucie et al.

Source: AIP Conference Proceedings. 2024, Vol. 3054 Issue 1, p1-5. 5p.

Effect of ion irradiation on 1uc CMO buffered LAO/STO interface.

Authors: Nehra, Simran Kumar, Sumit Shrivastava, Shikha et al.

Source: AIP Conference Proceedings. 2024, Vol. 2995 Issue 1, p1-4. 4p.

Growth and characterization of (Sc2O3)x(Ga2O3)1−x by molecular beam epitaxy.

Authors: Hlad, Mark S. Gila, Brent P. Abernathy, Cammy R. et al.

Source: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films. Jul2022, Vol. 40 Issue 4, p1-10. 10p.

Subjects: Molecular beam epitaxy, Reflection high energy electron diffraction, Gallium alloys, Gadolinium, Surface segregation, Transmission electron microscopy

Molecular beam epitaxy and crystal structure of majority a-plane-oriented and substrate-strained Mn3Sn thin films grown directly on sapphire (0001).

Authors: Upadhyay, Sneha Erickson, Tyler Hall, Hannah et al.

Source: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Jul2023, Vol. 41 Issue 4, p1-11, 11p

Stoichiometric Control and Optical Properties of BaTiO3 Thin Films Grown by Hybrid MBE.

Authors: Fazlioglu‐Yalcin, Benazir Suceava, Albert C. Kuznetsova, Tatiana et al.

Source: Advanced Materials Interfaces; 4/14/2023, Vol. 10 Issue 11, p1-9, 9p

Sensitive RHEED signature of Ti-excess enabling enhanced cationic composition control during the molecular beam epitaxy of SrTiO3 based solid solutions.

Authors: Razaghi Pey Ghaleh, Masoumeh d'Esperonnat, Marc Botella, Claude et al.

Source: CrystEngComm. 3/21/2021, Vol. 23 Issue 11, p2269-2275. 7p.

Subjects: Reflection high energy electron diffraction, Molecular beam epitaxy, Solid solutions, Surface reconstruction

Modeling of the hysteretic phenomena in RHEED intensity variation versus temperature for GaAs and InAs surfaces.

Authors: Nemcsics, Ákos Takács, Jenö

Source: Semiconductors. Jan2011, Vol. 45 Issue 1, p91-95. 5p.

Subjects: Reflection high energy electron diffraction, Hysteresis, Temperature effect, Arsenides, Surfaces (Technology), Optical reflection, Prediction models