Search Results - "Rodriguez, Noel"
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Authors: et al.
Source: Journal of Low Power Electronics & Applications; Jun2026, Vol. 16 Issue 2, p13, 21p
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Authors: et al.
Source: Advanced Materials Technologies; Apr2026, Vol. 11 Issue 7, p1-16, 16p
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Source: Advanced Electronic Materials; Jul2024, Vol. 10 Issue 7, p1-11, 11p
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Source: IEEE Transactions on Electron Devices; June 2010, Vol. 57 Issue 6, p1327-1333, 7p
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Source: IEEE Transactions on Electron Devices; July 2009, Vol. 56 Issue 7, p1507-1515, 9p
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Source: IEEE Electron Device Letters; June 2008, Vol. 29 Issue 6, p628-631, 4p
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Source: IEEE Transactions on Electron Devices; April 2007, Vol. 54 Issue 4, p723-732, 10p
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Source: Nanomaterials (2079-4991). Nov2022, Vol. 12 Issue 21, p3750. 2p.
Subjects: Nanostructured materials, Fiber Bragg gratings
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Source: IEEE Electron Device Letters; September 2010, Vol. 31 Issue 9, p972-974, 3p
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Source: IEEE Electron Device Letters; December 2009, Vol. 30 Issue 12, p1338-1340, 3p
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Source: IEEE Transactions on Electron Devices. Dec2017, Vol. 64 Issue 12, p5093-5098. 6p.
Subjects: Metal oxide semiconductor field-effect transistors, Ionization energy, Force & energy, Electron affinity, Transistors
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Authors: et al.
Source: International Journal of Circuit Theory & Applications; Apr2019, Vol. 47 Issue 4, p572-579, 8p
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Source: Solid-State Electronics. Feb2017, Vol. 128, p115-120. 6p.
Subjects: Burst noise, Algorithm research
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Source: Solid-State Electronics. Mar2016, Vol. 117, p60-65. 6p.
Subjects: Burst noise, Silicon, Metal oxide semiconductor field-effect transistors, Thermal properties, Electronic noise
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Authors: et al.
Source: IEEE Transactions on Electron Devices; Nov2017, Vol. 64 Issue 11, p4486-4491, 6p
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Source: Solid-State Electronics. Jan2015, Vol. 103, p7-14. 8p.
Subjects: Random access memory, Silicon-on-insulator technology, Bulk solids, Substrates (Materials science), Microfabrication, Electrons
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17
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Source: International Journal of High Speed Electronics & Systems. Mar2012, Vol. 21 Issue 1, p-1. 18p.
Subjects: Dynamic random access memory, Capacitor industry, Hydrostatics, Silicon-on-insulator technology, Transistors, Crystal structure, Hysteresis, Holes (Electron deficiencies)
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Source: Microelectronic Engineering. Jul2011, Vol. 88 Issue 7, p1236-1239. 4p.
Subjects: Metal oxide semiconductor field-effect transistors, Silicon-on-insulator technology, Poisson's equation, Interfaces (Physical sciences), Semiconductor wafers, Thin films, Electric potential, Mathematical models
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19
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Source: Solid-State Electronics. May2011, Vol. 59 Issue 1, p44-49. 6p.
Subjects: Capacitors, Metal oxide semiconductor field-effect transistors, Simulation methods & models, Electrostatics, Silicon-on-insulator technology, Random access memory, Electrons, Performance evaluation
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Authors: et al.
Source: Solid-State Electronics. Dec2009, Vol. 53 Issue 12, p1313-1317. 5p.
Subjects: Metal oxide semiconductor field-effect transistors, Gate array circuits, Semiconductor industry, Performance evaluation, Simulation methods & models, Electric contacts, Electric measurements, Solid phase extraction