Search Results - "Soft errors"

Reliability Analysis of the LEON3 Memory Subsystem Under Single-Event Upsets: Cache, AHB Interface, and Memory Controller Vulnerability.

Authors: Kchaou, Afef Saad, Sehmi Garrab, Hatem

Source: Information. Mar2026, Vol. 17 Issue 3, p249. 25p.

Enhancing the Reliability of AD936x-Based SDRs for Aerospace Applications via Active Register Scrubbing and Autonomous Fault Recovery.

Authors: Wang, Jinyang Wang, Zhugang Zhou, Li

Source: Sensors (14248220). Nov2025, Vol. 25 Issue 21, p6801. 17p.

A 12 transistor robust SRAM cell design for aerospace applications.

Authors: Kidwai, Shahneela Jamal Alam, Naushad Iqbal, Belal

Source: International Journal of Electronics. May2026, Vol. 113 Issue 5, p837-852. 16p.

Soft error risk assessment in carbon ion radiation therapy for prostate cancer.

Authors: Sakai, Makoto Imazu, Reika Shimizu, Shogo et al.

Source: Journal of Radioanalytical & Nuclear Chemistry. Sep2025, Vol. 334 Issue 9, p6653-6661. 9p.

Reliability of LEON3 Processor's Program Counter Against SEU, MBU, and SET Fault Injection.

Authors: Kchaou, Afef Saad, Sehmi Garrab, Hatem et al.

Source: Cryptography (2410-387X). Sep2025, Vol. 9 Issue 3, p54. 25p.

A Radiation-Hardened Low-Power SRAM with Enhanced Write Capability for Space Applications.

Authors: Kim, Sang-Jin Jo, Sung-Hun

Source: Applied Sciences (2076-3417); Jul2025, Vol. 15 Issue 13, p6988, 16p

Applying Reinforcement Learning to Protect Deep Neural Networks from Soft Errors.

Authors: Su, Peng Li, Yuhang Lu, Zhonghai et al.

Source: Sensors (14248220). Jul2025, Vol. 25 Issue 13, p4196. 22p.

A Low-Power Read-Decoupled Radiation-Hardened 16T SRAM for Space Applications.

Authors: Lim, Sung-Jun Jo, Sung-Hun

Source: Applied Sciences (2076-3417); Jun2025, Vol. 15 Issue 12, p6536, 14p

Tag Replication and Status Bits Encoding for Enhancing Cache Metadata Reliability.

Authors: Tabbakh, Abdulaziz Tani, Andrea

Source: Journal of Electrical & Computer Engineering; 5/25/2025, Vol. 2025, p1-10, 10p

A Low-Delay Power-Efficient 14T SRAM with Word-Line Separation for Radiation-Hardened Aerospace applications.

Authors: Cai, Shuo Wei, Maoxuan Huang, Zhu et al.

Source: Journal of Electronic Testing. Jun2026, p1-14. 14p.

Dual feedback radiation-tolerant SRAM for space application.

Authors: Sharma, Priyanka Nitesh Kumar, Soni Neema, Vaibhav et al.

Source: International Journal of Electronics; Jun2026, Vol. 113 Issue 6, p1127-1144, 18p

Novel Fault‐ Detection Implementation of FIR Filters Based on Multilevel Current‐Mode Berger Codes.

Authors: Omidi, Reza Ko, Seok-Bum

Source: IET Computers & Digital Techniques (Wiley-Blackwell); 5/14/2026, Vol. 2026, p1-11, 11p

A Portable, Compact, and Fault-Tolerant Processor for Spaceflight Applications.

Authors: Guzman-Garcia, David Ridley, Ryan J. Suarez, George et al.

Source: Aerospace (MDPI Publishing); May2026, Vol. 13 Issue 5, p464, 16p

Authentication safety: safe on-demand concurrent authentication under transient faults and arbitrary initialization.

Authors: Karaata, Mehmet Dabees, Aisha

Source: Computer Journal; May2026, Vol. 69 Issue 5, p865-887, 23p

Soft Error-Tolerant and Highly Stable Low-Power SRAM for Satellite Applications.

Authors: Oh, Jong-Yeob Jo, Sung-Hun

Source: Applied Sciences (2076-3417); Jan2025, Vol. 15 Issue 1, p375, 13p

Radiation-Hardened 16T SRAM Cell with Improved Read and Write Stability for Space Applications.

Authors: Oh, Jong-Yeob Jo, Sung-Hun

Source: Applied Sciences (2076-3417); Dec2024, Vol. 14 Issue 24, p11940, 14p

A Triple‐Node‐Upset Self‐Recovery Latch Features Low Soft Error Rate for Aerospace Applications.

Authors: Hao, Licai Li, Jiaqing Peng, Chunyu et al.

Source: International Journal of Circuit Theory & Applications. Apr2026, p1. 13p. 12 Illustrations.

Error Resilient Transformers: A Novel Soft Error Vulnerability Guided Approach to Error Checking and Suppression.

Authors: Ma, Kwondo Amarnath, Chandramouli Isenberg, Jackson et al.

Source: Journal of Electronic Testing. Apr2026, Vol. 42 Issue 2, p227-248. 22p.

Radiation-hardened Pipeline in Microcontroller Core.

Authors: XUE, Haiwei LI, Xinqiang WANG, Jinxiang et al.

Source: Atomic Energy Science & Technology; Mar2026, Vol. 60 Issue 3, p733-744, 12p

In Situ Single‐Event Upset Tolerant Flip‐Flip Designs for Nanoscale Technology.

Authors: Li, Hongchen Zhao, Xiaofeng Li, Jie et al.

Source: International Journal of Circuit Theory & Applications; Mar2026, Vol. 54 Issue 3, p1373-1384, 12p