Search Results - "Su, Zebin"
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Authors: et al.
Source: Journal of Natural Fibers. Dec2025, Vol. 22 Issue 1, p1-13. 13p.
Subjects: Digital printing, Detection algorithms, Loss functions (Statistics), Machine learning, Defect tracking (Computer software development), Acquisition of data, Surface defects
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Authors: et al.
Source: Journal of Natural Fibers. Dec2025, Vol. 22 Issue 1, p1-13. 13p.
Subjects: Digital printing, Detection algorithms, Manufacturing defects, Defect tracking (Computer software development), Object recognition (Computer vision), K-means clustering
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Authors: et al.
Source: Journal of the Textile Institute. Apr2024, Vol. 115 Issue 4, p600-606. 7p.
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Authors: et al.
Source: Journal of Engineered Fabrics & Fibers (JEFF). 10/31/2023, Vol. 18, p1-9. 9p.
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Authors: et al.
Source: Journal of Engineered Fabrics & Fibers (JEFF). 11/9/2022, Vol. 17, p1-8. 8p.
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Authors: et al.
Source: Coloration Technology. Jun2021, Vol. 137 Issue 3, p272-279. 8p.
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Authors: et al.
Source: Angewandte Chemie. 10/12/2020, Vol. 132 Issue 42, p18722-18730. 9p.
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Discovery of Structural Complexity through Self‐Assembly of Molecules Containing Rodlike Components.
Authors: et al.
Source: Chemistry - A European Journal. 5/26/2020, Vol. 26 Issue 30, p6741-6756. 16p.
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Authors: et al.
Source: Textile Research Journal. Dec2023, Vol. 93 Issue 23/24, p5237-5248. 12p.
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Authors: et al.
Source: Textile Research Journal. Dec2023, Vol. 93 Issue 23/24, p5211-5223. 13p.
Subjects: Digital printing, Image registration, Image compression, Textile printing, Problem solving
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Authors: et al.
Source: Textile Research Journal. May2022, Vol. 92 Issue 9/10, p1673-1681. 9p.
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Yarn apparent evenness detection based on L0 norm smoothing and the expectation maximization method.
Authors: et al.
Source: Textile Research Journal. Jan2023, Vol. 93 Issue 1/2, p422-433. 12p.
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Authors: et al.
Source: Angewandte Chemie International Edition; 7/11/2022, Vol. 61 Issue 28, p1-6, 6p
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Authors: et al.
Source: Angewandte Chemie International Edition; 5/2/2022, Vol. 61 Issue 19, p1-8, 8p
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Authors: et al.
Source: Angewandte Chemie International Edition; 1/25/2021, Vol. 60 Issue 4, p2024-2029, 6p
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Authors: et al.
Source: Electronics Letters (Wiley-Blackwell); 7/9/2020, Vol. 56 Issue 14, p709-712, 4p, 1 Diagram, 4 Charts, 3 Graphs
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Authors: et al.
Source: Angewandte Chemie International Edition; 3/23/2020, Vol. 59 Issue 13, p5226-5234, 9p
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Authors: et al.
Source: Angewandte Chemie International Edition; 8/19/2019, Vol. 58 Issue 34, p11879-11885, 7p
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Authors: et al.
Source: Chemistry - An Asian Journal; Jan2019, Vol. 14 Issue 1, p125-129, 5p
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