Search Results - "Turnquist, Matthew"

Extreme Path Delay Estimation of Critical Paths in Within-Die Process Fluctuations Using Multi-Parameter Distributions.

Authors: Runolinna, Miikka Turnquist, Matthew Teittinen, Jukka et al.

Source: Journal of Low Power Electronics & Applications; Mar2023, Vol. 13 Issue 1, p22, 14p

A Fully Integrated 2:1 Self-Oscillating Switched-Capacitor DC-DC Converter in 28 nm UTBB FD-SOI.

Authors: Turnquist, Matthew Hiienkari, Markus Mäkipää, Jani et al.

Source: Journal of Low Power Electronics & Applications; Sep2016, Vol. 6 Issue 3, p17, 12p

A Robust Ultra-Low Voltage CPU Utilizing Timing-Error Prevention.

Authors: Hiienkari, Markus Teittinen, Jukka Koskinen, Lauri et al.

Source: Journal of Low Power Electronics & Applications; 2015, Vol. 5 Issue 2, p57-68, 12p

Timing-Error Detection Design Considerations in Subthreshold: An 8-bit Microprocessor in 65 nm CMOS.

Authors: Mäkipää, Jani Turnquist, Matthew J. Laulainen, Erkka et al.

Source: Journal of Low Power Electronics & Applications; Jun2012, Vol. 2 Issue 2, p180-196, 17p

Implementing Minimum-Energy-Point Systems With Adaptive Logic.

Authors: Koskinen, Lauri Hiienkari, Markus Makipaa, Jani et al.

Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems; Apr2016, Vol. 24 Issue 4, p1247-1256, 10p

Expert Consensus Statement on Proficiency Standards for Dermoscopy Education in Primary Care.

Authors: Tran T Cyr PR Verdieck A et al.

Source: Journal of the American Board of Family Medicine : JABFM [J Am Board Fam Med] 2023 Feb 08; Vol. 36 (1), pp. 25-38.

Publication Type: Journal Article; Research Support, Non-U.S. Gov't; Consensus Statement

Journal Info: Publisher: American Board of Family Medicine Country of Publication: United States NLM ID: 101256526 Publication Model: Print Cited Medium: Internet ISSN: 1558-7118 (Electronic) Linking ISSN: 15572625 NLM ISO Abbreviation: J Am Board Fam Med Subsets: MEDLINE