Search Results - "X-ray microscopy"

Total‐reflection‐based microscope compatible with X‐ray and visible light for sample positioning.

Authors: Yoshinaga, Kyota O'Neal, Jordan Tyler Sakurai, Kai et al.

Source: Journal of Synchrotron Radiation. May2026, Vol. 33 Issue 3, p604-608. 5p.

Subjects: X-ray microscopy, Calibration, Microscopes, Mirrors, Total internal reflection (Optics), X-ray imaging, Biological specimens

Phase and absorbance retrieval in X‐ray holographic microscopy under weak illumination using physics‐driven neural networks.

Authors: Kim, Jihwan Lim, Jun Jo, Sugeun et al.

Source: Journal of Synchrotron Radiation. May2026, Vol. 33 Issue 3, p794-805. 12p.

Subjects: X-ray microscopy, Deep learning, Densitometry, Three-dimensional imaging, Image reconstruction

DEMETER - Soft X-Ray Micro-Spectroscopy Beamline at NRSC SOLARIS and Its Performance in the Study of Magnetic Materials.

Authors: MANDZIAK, A. MATLAK, K. WOLANIN, B. et al.

Source: Acta Physica Polonica: A. 2026, Vol. 149 Issue 5, pS174-S182. 9p.

Defocused illumination with beam‐shaping condenser for uniform wide‐field X‐ray imaging.

Authors: Zhang, Kuanqiang Luo, Yijue Di, Yunfan et al.

Source: Journal of Synchrotron Radiation. Mar2026, Vol. 33 Issue 2, p429-436. 8p.

Subjects: X-ray microscopy, Diffraction patterns, Light sources, Radiance, Fresnel diffraction, Soft X rays, Imaging systems

Time‐resolved imaging of electron beam powder bed fusion using an X‐ray microscope optimized for white beam radiation.

Authors: Bidola, Pidassa Semjatov, Nick Spartacus, Gabriel et al.

Source: Journal of Synchrotron Radiation. Jan2026, Vol. 33 Issue 1, p181-194. 14p.

Subjects: X-ray microscopy, X-ray imaging, Imaging systems, High resolution imaging, Electron beam melting, Nickel alloys, Crack formation in solids, Spatial resolution

A high‐temperature furnace for multimodal synchrotron‐based X‐ray microscopy and diffraction imaging.

Authors: Lesage, Louis Watier, Yves Isern, Helena et al.

Source: Journal of Synchrotron Radiation. Jan2026, Vol. 33 Issue 1, p115-122. 8p.

Subjects: X-ray microscopy, Materials science, Thermal stability, Synchrotron radiation sources, Optical diffraction, Phase transitions, European Synchrotron Radiation Facility, Furnaces, Three-dimensional printing

Soil potassium adsorption and speciation dynamics with associated clay microstructural changes revealed by synchrotron X-ray microscopy.

Authors: Poonpakdee, Chakkrit Weng, Chih-Huang Wolde, Girma Sisay et al.

Source: Scientific Reports. 9/26/2025, Vol. 15 Issue 1, p1-10. 10p.

Near‐Freezing‐Temperature Golgi Neuronal Staining for X‐ray Imaging of Human Brain.

Authors: Zhou, Feng Tang, Qiaowei Yan, Xin et al.

Source: Advanced Science. 8/14/2025, Vol. 12 Issue 30, p1-11. 11p.

Three-dimensional nucleation and growth of deformation twins in magnesium.

Authors: Lee, Sangwon Pilipchuk, Michael Yildirim, Can et al.

Source: Science. 8/7/2025, Vol. 389 Issue 6760, p632-636. 5p.

Subjects: Nucleation, Microstructure, Thin films, Ellipsoids, X-ray microscopy

Three-dimensional high-content imaging of unstained soft tissue with subcellular resolution using a laboratory-based X-ray microscope.

Authors: Esposito, Michela Astolfo, Alberto Zhou, Yang et al.

Source: Proceedings of the National Academy of Sciences of the United States of America. 3/24/2026, Vol. 123 Issue 12, p1-8. 18p.

Subjects: X-ray microscopy, Three-dimensional imaging, X-ray imaging, High resolution imaging, Machine learning, Histopathology, Connective tissues, Histology

Computation and sensitivity analysis of the deformation gradient tensor reconstruction in dark‐field X‐ray microscopy.

Authors: Kanesalingam, Brinthan Chalise, Darshan Detlefs, Carsten et al.

Source: Journal of Applied Crystallography; Jun2026, Vol. 59 Issue 3, p716-736, 21p

Discovery of spontaneous mesoscopic strain waves in nematic domains using dark-field x-ray microscopy.

Authors: Yay, Kaan A. Meese, William J. Kisiel, Elliot et al.

Source: Science Advances. 5/22/2026, Vol. 12 Issue 21, p1-10. 10p.

Titanium‐Modified Silicon Oxycarbide as an Efficient Sulfur Host for Lithium–Sulfur Batteries.

Authors: Amaral, Murilo M. Roy, Arijit Pinzón C., Manuel J. et al.

Source: Batteries & Supercaps; May2026, Vol. 9 Issue 5, p1-14, 14p

Imaging hydrogen's effect on single crystal austenitic stainless steel microstructure using dark-field X-ray microscopy.

Authors: Pal, Dayeeta Luccioni, Dorian P. Yildirim, Can et al.

Source: Materials Research Letters; May2026, Vol. 14 Issue 5, p580-592, 13p

Damage‐limited resolution for X‐ray and electron microscopy of organic specimens.

Authors: Egerton, Ray F. Nave, Colin

Source: Acta Crystallographica: Section D, Structural Biology. May2026, Vol. 82 Issue 5, p471-483. 13p.

In situ isotropic 3D imaging of vasculature perfusion specimens using x‐ray microscopic dual‐energy CT.

Authors: Handschuh, Stephan Reichart, Ursula Kummer, Stefan et al.

Source: Journal of Microscopy. Feb2025, Vol. 297 Issue 2, p179-202. 24p.

Subjects: Blood vessels, X-ray microscopy, Dual energy CT (Tomography), Chemical sample preparation, Three-dimensional imaging, Contrast media, Microcirculation

Enhanced Imaging in Scanning Transmission X-Ray Microscopy Assisted by Ptychography.

Authors: Wu, Shuhan Xu, Zijian Li, Ruoru et al.

Source: Nanomaterials (2079-4991). Apr2025, Vol. 15 Issue 7, p496. 18p.

Subjects: Image reconstruction, X-ray microscopy, X-ray imaging, Image intensifiers, Image transmission

Evolution Mechanisms of Three-Dimensional Fracture Fields in Coal Under Uniaxial Cyclic Loading and Unloading.

Authors: Xu, Jiankun Zhou, Rui Xi, Danyang et al.

Source: Applied Sciences (2076-3417); Mar2025, Vol. 15 Issue 5, p2556, 17p

Sample Preparation Protocol for Laboratory Cryo-Soft X-Ray Microscopy for Studying Cellular Nanoparticle Uptake.

Authors: Arsana, Komang G. Y. Svenda, Martin Hertz, Hans M.

Source: International Journal of Molecular Sciences. Feb2025, Vol. 26 Issue 4, p1657. 13p.

NONDESTRUCTIVE 3D X-RAY MICROSCOPY SPEEDS THROUGHPUT IN NEW FAILURE ANALYSIS WORKFLOWS.

Authors: Hartfield, Cheryl¹ cheryl.hartfield@zeiss.com

Source: Electronic Device Failure Analysis. Nov2024, Vol. 26 Issue 4, p14-19. 6p.

Subjects: Failure analysis, X-ray microscopy, High performance computing