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Spacecraft and Instrument Photoelectrons Measured by the Dual Electron Spectrometers on MMS.

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Title: Spacecraft and Instrument Photoelectrons Measured by the Dual Electron Spectrometers on MMS.
Authors: Gershman, Daniel J.1,2, Avanov, Levon A.1,2, Boardsen, Scott A.2,3, Dorelli, John C.2, Gliese, Ulrik2,4, Barrie, Alexander C.2,5, Schiff, Conrad2, Paterson, William R.2, Torbert, Roy B.6,7, Giles, Barbara L.2, Pollock, Craig J.2,8
Source: Journal of Geophysical Research. Space Physics. Nov2017, Vol. 122 Issue 11, p11,548-11,558. 11p.
Abstract: Secondary electrons are continuously generated via photoemission from sunlit spacecraft and instrument surfaces. These particles can subsequently contaminate low-energy channels of electron sensors. Spacecraft photoelectrons are measured at energies below that of a positive spacecraft potential and can be removed at the expense of energy resolution. However, fluxes of photoelectrons generated inside electron instruments are independent of spacecraft potential and must be fully characterized in order to correct electron data. Here we present observations of spacecraft and instrument photoelectron populations measured with the Dual Electron Spectrometers (DES) on NASA's Magnetospheric Multiscale (MMS) mission. We leverage observations from Earth's nightside plasma sheet taken during MMS commissioning and develop an empirical model of instrument photoelectrons. This model is used with DES velocity distribution functions to correct plasma moments and has been made publicly available on the MMS science data center for use by the scientific community. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Geophysical Research. Space Physics is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: Spacecraft and Instrument Photoelectrons Measured by the Dual Electron Spectrometers on MMS.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Geophysical+Research%2E+Space+Physics%22">Journal of Geophysical Research. Space Physics</searchLink>. Nov2017, Vol. 122 Issue 11, p11,548-11,558. 11p.
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  Data: Secondary electrons are continuously generated via photoemission from sunlit spacecraft and instrument surfaces. These particles can subsequently contaminate low-energy channels of electron sensors. Spacecraft photoelectrons are measured at energies below that of a positive spacecraft potential and can be removed at the expense of energy resolution. However, fluxes of photoelectrons generated inside electron instruments are independent of spacecraft potential and must be fully characterized in order to correct electron data. Here we present observations of spacecraft and instrument photoelectron populations measured with the Dual Electron Spectrometers (DES) on NASA's Magnetospheric Multiscale (MMS) mission. We leverage observations from Earth's nightside plasma sheet taken during MMS commissioning and develop an empirical model of instrument photoelectrons. This model is used with DES velocity distribution functions to correct plasma moments and has been made publicly available on the MMS science data center for use by the scientific community. [ABSTRACT FROM AUTHOR]
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  Data: <i>Copyright of Journal of Geophysical Research. Space Physics is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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