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In-line spectroscopic ellipsometry for the monitoring of the optical properties and quality of roll-to-roll printed nanolayers for organic photovoltaics

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Title: In-line spectroscopic ellipsometry for the monitoring of the optical properties and quality of roll-to-roll printed nanolayers for organic photovoltaics
Authors: Logothetidis, Stergios logot@auth.gr, Georgiou, Despoina1, Laskarakis, Argiris1, Koidis, Christos1, Kalfagiannis, Nikolaos1
Source: Solar Energy Materials & Solar Cells. May2013, Vol. 112, p144-156. 13p.
Subject Terms: Ellipsometry, Microfabrication, Organic electronics, Ultraviolet spectroscopy, Optical properties, Fullerenes, Vacuum ultraviolet spectroscopy, Semiconductors
Abstract: Abstract: The fabrication of organic electronics devices onto flexible polymer substrates by roll-to-roll (r2r) processes requires the use of in-line quality control tools for the optimization of the optical and electronic properties of semiconducting, electrodes and barrier layers and their thickness that will achieve the required performance and lifetime of the devices. This paper focuses of the investigation of the optical properties of r2r printed nanolayers for organic photovoltaics, by in-line spectroscopic ellipsometry (SE) in the visible-far ultraviolet spectral region. This is performed by a prototype very fast stand-alone SE unit adapted onto a lab-scale r2r system. First, we test the stability and precision of measurements to validate the optical measurements and the analysis procedure. Afterward, we report on the robust determination of the thickness and optical properties of barrier thin layers (a combination of SiO x and hybrid polymer bilayers), PEDOT:PSS transparent electrodes and polymer:fullerene (P3HT:PCBM) blends that were gravure printed onto flexible PET substrates in the form of rolls. Finally, we discuss on the effect of the experimental parameters on the optical properties and the quality of the printed nanolayers as determined by the modeling approaches of the in-line measurements. [Copyright &y& Elsevier]
Copyright of Solar Energy Materials & Solar Cells is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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DbLabel: GreenFILE
An: 86398569
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PubTypeId: academicJournal
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  Data: In-line spectroscopic ellipsometry for the monitoring of the optical properties and quality of roll-to-roll printed nanolayers for organic photovoltaics
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  Data: <searchLink fieldCode="AR" term="%22Logothetidis%2C+Stergios%22">Logothetidis, Stergios</searchLink><i> logot@auth.gr</i><br /><searchLink fieldCode="AR" term="%22Georgiou%2C+Despoina%22">Georgiou, Despoina</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Laskarakis%2C+Argiris%22">Laskarakis, Argiris</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Koidis%2C+Christos%22">Koidis, Christos</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Kalfagiannis%2C+Nikolaos%22">Kalfagiannis, Nikolaos</searchLink><relatesTo>1</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Solar+Energy+Materials+%26+Solar+Cells%22">Solar Energy Materials & Solar Cells</searchLink>. May2013, Vol. 112, p144-156. 13p.
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  Data: <searchLink fieldCode="DE" term="%22Ellipsometry%22">Ellipsometry</searchLink><br /><searchLink fieldCode="DE" term="%22Microfabrication%22">Microfabrication</searchLink><br /><searchLink fieldCode="DE" term="%22Organic+electronics%22">Organic electronics</searchLink><br /><searchLink fieldCode="DE" term="%22Ultraviolet+spectroscopy%22">Ultraviolet spectroscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Optical+properties%22">Optical properties</searchLink><br /><searchLink fieldCode="DE" term="%22Fullerenes%22">Fullerenes</searchLink><br /><searchLink fieldCode="DE" term="%22Vacuum+ultraviolet+spectroscopy%22">Vacuum ultraviolet spectroscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Semiconductors%22">Semiconductors</searchLink>
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  Data: Abstract: The fabrication of organic electronics devices onto flexible polymer substrates by roll-to-roll (r2r) processes requires the use of in-line quality control tools for the optimization of the optical and electronic properties of semiconducting, electrodes and barrier layers and their thickness that will achieve the required performance and lifetime of the devices. This paper focuses of the investigation of the optical properties of r2r printed nanolayers for organic photovoltaics, by in-line spectroscopic ellipsometry (SE) in the visible-far ultraviolet spectral region. This is performed by a prototype very fast stand-alone SE unit adapted onto a lab-scale r2r system. First, we test the stability and precision of measurements to validate the optical measurements and the analysis procedure. Afterward, we report on the robust determination of the thickness and optical properties of barrier thin layers (a combination of SiO x and hybrid polymer bilayers), PEDOT:PSS transparent electrodes and polymer:fullerene (P3HT:PCBM) blends that were gravure printed onto flexible PET substrates in the form of rolls. Finally, we discuss on the effect of the experimental parameters on the optical properties and the quality of the printed nanolayers as determined by the modeling approaches of the in-line measurements. [Copyright &y& Elsevier]
– Name: AbstractSuppliedCopyright
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  Data: <i>Copyright of Solar Energy Materials & Solar Cells is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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RecordInfo BibRecord:
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        Value: 10.1016/j.solmat.2013.01.007
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      – Code: eng
        Text: English
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        PageCount: 13
        StartPage: 144
    Subjects:
      – SubjectFull: Ellipsometry
        Type: general
      – SubjectFull: Microfabrication
        Type: general
      – SubjectFull: Organic electronics
        Type: general
      – SubjectFull: Ultraviolet spectroscopy
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      – SubjectFull: Optical properties
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      – SubjectFull: Fullerenes
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      – SubjectFull: Vacuum ultraviolet spectroscopy
        Type: general
      – SubjectFull: Semiconductors
        Type: general
    Titles:
      – TitleFull: In-line spectroscopic ellipsometry for the monitoring of the optical properties and quality of roll-to-roll printed nanolayers for organic photovoltaics
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            NameFull: Logothetidis, Stergios
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            NameFull: Georgiou, Despoina
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            NameFull: Laskarakis, Argiris
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            NameFull: Koidis, Christos
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            NameFull: Kalfagiannis, Nikolaos
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              M: 05
              Text: May2013
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              Y: 2013
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              Value: 112
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