Special issue for the ICST 2013 conference.

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Bibliographic Details
Title: Special issue for the ICST 2013 conference.
Authors: Baudry, Benoit1, Benoit.Baudry@inria.fr, Orso, Alessandro2, orso@cc.gatech.edu
Source: Software Testing: Verification & Reliability; Jun2015, Vol. 25 Issue 4, p333-333, 1p
Database: Applied Science & Technology Source
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