Effect of dopants on the epitaxial growth and oxygen diffusion behaviors of CeO buffer layer for coated conductors.

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Title: Effect of dopants on the epitaxial growth and oxygen diffusion behaviors of CeO buffer layer for coated conductors.
Authors: Wang, H., Cao, L.1, whuifs@126.com, Wang, Y.2, Jin, L.2, Liu, J.2, Huang, J.1, Li, C.2
Source: Journal of Materials Science: Materials in Electronics; Jun2015, Vol. 26 Issue 6, p3874-3880, 7p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 102603595
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Effect of dopants on the epitaxial growth and oxygen diffusion behaviors of CeO buffer layer for coated conductors.
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  Data: <searchLink fieldCode="AU" term="%22Wang%2C+H%2E%22">Wang, H.</searchLink><br /><searchLink fieldCode="AU" term="%22Cao%2C+L%2E%22">Cao, L.</searchLink><relatesTo>1</relatesTo>, <i>whuifs@126.com</i><br /><searchLink fieldCode="AU" term="%22Wang%2C+Y%2E%22">Wang, Y.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Jin%2C+L%2E%22">Jin, L.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Liu%2C+J%2E%22">Liu, J.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Huang%2C+J%2E%22">Huang, J.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Li%2C+C%2E%22">Li, C.</searchLink><relatesTo>2</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%3A+Materials+in+Electronics%22">Journal of Materials Science: Materials in Electronics</searchLink>; Jun2015, Vol. 26 Issue 6, p3874-3880, 7p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=102603595
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1007/s10854-015-2914-6
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      – Code: eng
        Text: English
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        PageCount: 7
        StartPage: 3874
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      – TitleFull: Effect of dopants on the epitaxial growth and oxygen diffusion behaviors of CeO buffer layer for coated conductors.
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            NameFull: Wang, H.
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            NameFull: Cao, L.
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            NameFull: Wang, Y.
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            NameFull: Jin, L.
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            NameFull: Liu, J.
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            NameFull: Huang, J.
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            – D: 01
              M: 06
              Text: Jun2015
              Type: published
              Y: 2015
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              Value: 26
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            – TitleFull: Journal of Materials Science: Materials in Electronics
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