Ab initio and atomistic simulation of local structure and defect segregation on the tilt grain boundaries in silicon.

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Title: Ab initio and atomistic simulation of local structure and defect segregation on the tilt grain boundaries in silicon.
Authors: Lazebnykh, Vitaly Yu.1, Mysovsky, Andrey S.1,2, mysovsky@gmail.com
Source: Journal of Applied Physics; 2015, Vol. 118 Issue 13, p135704-1-135704-8, 8p, 1 Black and White Photograph, 3 Diagrams, 4 Charts, 4 Graphs
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 110208656
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Ab initio and atomistic simulation of local structure and defect segregation on the tilt grain boundaries in silicon.
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  Data: <searchLink fieldCode="AU" term="%22Lazebnykh%2C+Vitaly+Yu%2E%22">Lazebnykh, Vitaly Yu.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Mysovsky%2C+Andrey+S%2E%22">Mysovsky, Andrey S.</searchLink><relatesTo>1,2</relatesTo>, <i>mysovsky@gmail.com</i>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>; 2015, Vol. 118 Issue 13, p135704-1-135704-8, 8p, 1 Black and White Photograph, 3 Diagrams, 4 Charts, 4 Graphs
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=110208656
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1063/1.4932203
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      – Code: eng
        Text: English
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      Pagination:
        PageCount: 8
        StartPage: 135704-1
    Titles:
      – TitleFull: Ab initio and atomistic simulation of local structure and defect segregation on the tilt grain boundaries in silicon.
        Type: main
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            NameFull: Lazebnykh, Vitaly Yu.
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            NameFull: Mysovsky, Andrey S.
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            – D: 05
              M: 10
              Text: 2015
              Type: published
              Y: 2015
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              Value: 118
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              Value: 13
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            – TitleFull: Journal of Applied Physics
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