Improved Electrical Characteristics of Ge pMOSFETs With ZrO2/HfO2 Stack Gate Dielectric. - Li, Chen-Chien; Chang-Liao, Kuei-Shu; Chi, Wei-Fong; Li, Mong-Chi; Chen, Ting-Chun; Su, Tzu-Hsiang; Chang, Yu-Wei; Tsai, Chia-Chi; Liu, Li-Jung; Fu, Chung-Hao; Lu, Chun-Chang (IEEE Electron Device Letters, 2016)