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Single-Event Effect Performance of a Conductive-Bridge Memory EEPROM.

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Title: Single-Event Effect Performance of a Conductive-Bridge Memory EEPROM.
Authors: Chen, Dakai1, Wilcox, Edward2, Berg, Melanie2, Kim, Hak2, Phan, Anthony2, Figueiredo, Marco3, Seidleck, Christina2, LaBel, Kenneth1
Source: IEEE Transactions on Nuclear Science; Dec2015 Part 1, Vol. 62 Issue 6a, p2703-2708, 6p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 115132529
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1109/TNS.2015.2476475
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      – Code: eng
        Text: English
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        PageCount: 6
        StartPage: 2703
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      – TitleFull: Single-Event Effect Performance of a Conductive-Bridge Memory EEPROM.
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            NameFull: Chen, Dakai
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            NameFull: Wilcox, Edward
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            NameFull: Phan, Anthony
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            NameFull: Figueiredo, Marco
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            NameFull: Seidleck, Christina
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            NameFull: LaBel, Kenneth
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            – D: 01
              M: 12
              Text: Dec2015 Part 1
              Type: published
              Y: 2015
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              Value: 6a
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            – TitleFull: IEEE Transactions on Nuclear Science
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