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Probabilistic Bug-Masking Analysis for Post-Silicon Tests in Microprocessor Verification.

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Title: Probabilistic Bug-Masking Analysis for Post-Silicon Tests in Microprocessor Verification.
Authors: Doowon Lee1, doowon@umich.edu, Kolan, Tom2, valeria@umich.edu, Morgenshtein, Arkadiy2, tomk@il.ibm.com, Sokhin, Vitali2, arkadiym@il.ibm.com, Mrad, Ronny2, vitali@il.ibm.com, Ziv, Avi2, morad@il.ibm.com, Bertacco, Valeria1, aziv@il.ibm.com
Source: DAC: Annual ACM/IEEE Design Automation Conference; Jun2016, p138-143, 6p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
An: 116210516
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PubType: Conference
PubTypeId: conference
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  Data: Probabilistic Bug-Masking Analysis for Post-Silicon Tests in Microprocessor Verification.
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  Data: <searchLink fieldCode="AU" term="%22Doowon+Lee%22">Doowon Lee</searchLink><relatesTo>1</relatesTo>, <i>doowon@umich.edu</i><br /><searchLink fieldCode="AU" term="%22Kolan%2C+Tom%22">Kolan, Tom</searchLink><relatesTo>2</relatesTo>, <i>valeria@umich.edu</i><br /><searchLink fieldCode="AU" term="%22Morgenshtein%2C+Arkadiy%22">Morgenshtein, Arkadiy</searchLink><relatesTo>2</relatesTo>, <i>tomk@il.ibm.com</i><br /><searchLink fieldCode="AU" term="%22Sokhin%2C+Vitali%22">Sokhin, Vitali</searchLink><relatesTo>2</relatesTo>, <i>arkadiym@il.ibm.com</i><br /><searchLink fieldCode="AU" term="%22Mrad%2C+Ronny%22">Mrad, Ronny</searchLink><relatesTo>2</relatesTo>, <i>vitali@il.ibm.com</i><br /><searchLink fieldCode="AU" term="%22Ziv%2C+Avi%22">Ziv, Avi</searchLink><relatesTo>2</relatesTo>, <i>morad@il.ibm.com</i><br /><searchLink fieldCode="AU" term="%22Bertacco%2C+Valeria%22">Bertacco, Valeria</searchLink><relatesTo>1</relatesTo>, <i>aziv@il.ibm.com</i>
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  Data: <searchLink fieldCode="JN" term="%22DAC%3A+Annual+ACM%2FIEEE+Design+Automation+Conference%22">DAC: Annual ACM/IEEE Design Automation Conference</searchLink>; Jun2016, p138-143, 6p
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      – Type: doi
        Value: 10.1145/2897937.2898072
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      – Code: eng
        Text: English
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      Pagination:
        PageCount: 6
        StartPage: 138
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      – TitleFull: Probabilistic Bug-Masking Analysis for Post-Silicon Tests in Microprocessor Verification.
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            NameFull: Doowon Lee
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            NameFull: Kolan, Tom
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            NameFull: Mrad, Ronny
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            – D: 01
              M: 06
              Text: Jun2016
              Type: published
              Y: 2016
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              Value: 0738100X
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