On the series resistance in staggered amorphous thin film transistors.

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Title: On the series resistance in staggered amorphous thin film transistors.
Authors: Cerdeira, Antonio1, cerdeira@cinvestav.mx, Estrada, Magali1, Marsal, Lluis F.2, Pallares, Josep2, Iñiguez, Benjamín2
Source: Microelectronics Reliability; Aug2016, Vol. 63, p325-335, 11p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 117160247
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=117160247
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1016/j.microrel.2016.05.005
    Languages:
      – Code: eng
        Text: English
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        PageCount: 11
        StartPage: 325
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      – TitleFull: On the series resistance in staggered amorphous thin film transistors.
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            NameFull: Cerdeira, Antonio
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            NameFull: Estrada, Magali
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            NameFull: Marsal, Lluis F.
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            NameFull: Pallares, Josep
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            NameFull: Iñiguez, Benjamín
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              M: 08
              Text: Aug2016
              Type: published
              Y: 2016
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              Value: 63
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            – TitleFull: Microelectronics Reliability
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