On the series resistance in staggered amorphous thin film transistors.
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| Title: | On the series resistance in staggered amorphous thin film transistors. |
|---|---|
| Authors: | Cerdeira, Antonio1, cerdeira@cinvestav.mx, Estrada, Magali1, Marsal, Lluis F.2, Pallares, Josep2, Iñiguez, Benjamín2 |
| Source: | Microelectronics Reliability; Aug2016, Vol. 63, p325-335, 11p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 117160247 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=117160247 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1016/j.microrel.2016.05.005 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 11 StartPage: 325 Titles: – TitleFull: On the series resistance in staggered amorphous thin film transistors. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Cerdeira, Antonio – PersonEntity: Name: NameFull: Estrada, Magali – PersonEntity: Name: NameFull: Marsal, Lluis F. – PersonEntity: Name: NameFull: Pallares, Josep – PersonEntity: Name: NameFull: Iñiguez, Benjamín IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 08 Text: Aug2016 Type: published Y: 2016 Identifiers: – Type: issn-print Value: 00262714 Numbering: – Type: volume Value: 63 Titles: – TitleFull: Microelectronics Reliability Type: main |
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