Effective medium approximation of ellipsometric response from random surface roughness simulated by finite-element method.

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Title: Effective medium approximation of ellipsometric response from random surface roughness simulated by finite-element method.
Authors: Fodor, B.1,2, fodor@mfa.kfki.hu, Kozma, P.1, Burger, S.3, Fried, M.1,4, Petrik, P.1,4
Source: Thin Solid Films; Oct2016 Part A, Vol. 617, p20-24, 5p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 119440983
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Effective medium approximation of ellipsometric response from random surface roughness simulated by finite-element method.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Fodor%2C+B%2E%22">Fodor, B.</searchLink><relatesTo>1,2</relatesTo>, <i>fodor@mfa.kfki.hu</i><br /><searchLink fieldCode="AU" term="%22Kozma%2C+P%2E%22">Kozma, P.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Burger%2C+S%2E%22">Burger, S.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Fried%2C+M%2E%22">Fried, M.</searchLink><relatesTo>1,4</relatesTo><br /><searchLink fieldCode="AU" term="%22Petrik%2C+P%2E%22">Petrik, P.</searchLink><relatesTo>1,4</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Thin+Solid+Films%22">Thin Solid Films</searchLink>; Oct2016 Part A, Vol. 617, p20-24, 5p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=119440983
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1016/j.tsf.2016.01.054
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 5
        StartPage: 20
    Titles:
      – TitleFull: Effective medium approximation of ellipsometric response from random surface roughness simulated by finite-element method.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Fodor, B.
      – PersonEntity:
          Name:
            NameFull: Kozma, P.
      – PersonEntity:
          Name:
            NameFull: Burger, S.
      – PersonEntity:
          Name:
            NameFull: Fried, M.
      – PersonEntity:
          Name:
            NameFull: Petrik, P.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 30
              M: 10
              Text: Oct2016 Part A
              Type: published
              Y: 2016
          Identifiers:
            – Type: issn-print
              Value: 00406090
          Numbering:
            – Type: volume
              Value: 617
          Titles:
            – TitleFull: Thin Solid Films
              Type: main
ResultId 1