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Editorial Year-in-Review.

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Bibliographic Details
Title: Editorial Year-in-Review.
Authors: Liu, Tsu-Jae King
Source: IEEE Electron Device Letters; Mar2017, Vol. 38 Issue 3, p297-297, 1p
Database: Applied Science & Technology Source
FullText Text:
  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 121461986
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1109/LED.2017.2657279
    Languages:
      – Code: eng
        Text: English
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        PageCount: 1
        StartPage: 297
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      – TitleFull: Editorial Year-in-Review.
        Type: main
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            NameFull: Liu, Tsu-Jae King
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            – D: 01
              M: 03
              Text: Mar2017
              Type: published
              Y: 2017
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              Value: 38
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            – TitleFull: IEEE Electron Device Letters
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