Fast Bit Screening of Automotive Grade EEPROMs—Continuous Improvement Exercise.
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| Title: | Fast Bit Screening of Automotive Grade EEPROMs—Continuous Improvement Exercise. |
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| Authors: | Sarson, Peter G.1, Schatzberger, Gregor1, Leisenberger, Friedrich Peter1 |
| Source: | IEEE Transactions on Very Large Scale Integration (VLSI) Systems; Apr2017, Vol. 25 Issue 4, p1250-1260, 11p |
| Database: | Applied Science & Technology Source |
| ISSN: | 10638210 |
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| DOI: | 10.1109/TVLSI.2016.2634589 |
