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Fast Bit Screening of Automotive Grade EEPROMs—Continuous Improvement Exercise.

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Bibliographic Details
Title: Fast Bit Screening of Automotive Grade EEPROMs—Continuous Improvement Exercise.
Authors: Sarson, Peter G.1, Schatzberger, Gregor1, Leisenberger, Friedrich Peter1
Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems; Apr2017, Vol. 25 Issue 4, p1250-1260, 11p
Database: Applied Science & Technology Source
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  Availability: 0
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DbLabel: Applied Science & Technology Source
An: 122013724
AccessLevel: 2
PubType: Academic Journal
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        Value: 10.1109/TVLSI.2016.2634589
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      – Code: eng
        Text: English
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        PageCount: 11
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      – TitleFull: Fast Bit Screening of Automotive Grade EEPROMs—Continuous Improvement Exercise.
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            NameFull: Sarson, Peter G.
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              Text: Apr2017
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