APA (7th ed.) Citation

Masarotto, L., Frey, L., Charles, M., Roule, A., Rodriguez, G., Souil, R., . . . Larrey, V. (2017). Transmission measurements of multilayer interference filters developed for a full integration on Complementary Metal Oxide Semiconductor chips. Thin Solid Films, 631, 23. https://doi.org/10.1016/j.tsf.2017.03.055

Chicago Style (17th ed.) Citation

Masarotto, L., L. Frey, M.L Charles, A. Roule, G. Rodriguez, R. Souil, C. Morales, and V. Larrey. "Transmission Measurements of Multilayer Interference Filters Developed for a Full Integration on Complementary Metal Oxide Semiconductor Chips." Thin Solid Films 631 (2017): 23. https://doi.org/10.1016/j.tsf.2017.03.055.

MLA (9th ed.) Citation

Masarotto, L., et al. "Transmission Measurements of Multilayer Interference Filters Developed for a Full Integration on Complementary Metal Oxide Semiconductor Chips." Thin Solid Films, vol. 631, 2017, p. 23, https://doi.org/10.1016/j.tsf.2017.03.055.