APA (7th ed.) Citation

Dunsworth, A., Megrant, A., Quintana, C., Chen, Z., Barends, R., Burkett, B., . . . Vainsencher, A. (2017). Characterization and reduction of capacitive loss induced by sub-micron Josephson junction fabrication in superconducting qubits. Applied Physics Letters, 111(2), 1. https://doi.org/10.1063/1.4993577

Chicago Style (17th ed.) Citation

Dunsworth, A., et al. "Characterization and Reduction of Capacitive Loss Induced by Sub-micron Josephson Junction Fabrication in Superconducting Qubits." Applied Physics Letters 111, no. 2 (2017): 1. https://doi.org/10.1063/1.4993577.

MLA (9th ed.) Citation

Dunsworth, A., et al. "Characterization and Reduction of Capacitive Loss Induced by Sub-micron Josephson Junction Fabrication in Superconducting Qubits." Applied Physics Letters, vol. 111, no. 2, 2017, p. 1, https://doi.org/10.1063/1.4993577.