Bibliographic Details
| Title: |
Characterization and reduction of capacitive loss induced by sub-micron Josephson junction fabrication in superconducting qubits. |
| Authors: |
Dunsworth, A.1, Megrant, A.2, Quintana, C.1, Zijun Chen1, Barends, R.2, Burkett, B.2, Foxen, B.1, Yu Chen2, Chiaro, B.1, Fowler, A.2, Graff, R.2, Jeffrey, E.2, Kelly, J.2, Lucero, E.2, Mutus, J. Y.2, Neeley, M.2, Neill, C.1, Roushan, P.2, Sank, D.2, Vainsencher, A.2 |
| Source: |
Applied Physics Letters; 7/10/2017, Vol. 111 Issue 2, p1-4, 4p |
| Database: |
Applied Science & Technology Source |
