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Characterization and reduction of capacitive loss induced by sub-micron Josephson junction fabrication in superconducting qubits.

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Title: Characterization and reduction of capacitive loss induced by sub-micron Josephson junction fabrication in superconducting qubits.
Authors: Dunsworth, A.1, Megrant, A.2, Quintana, C.1, Zijun Chen1, Barends, R.2, Burkett, B.2, Foxen, B.1, Yu Chen2, Chiaro, B.1, Fowler, A.2, Graff, R.2, Jeffrey, E.2, Kelly, J.2, Lucero, E.2, Mutus, J. Y.2, Neeley, M.2, Neill, C.1, Roushan, P.2, Sank, D.2, Vainsencher, A.2
Source: Applied Physics Letters; 7/10/2017, Vol. 111 Issue 2, p1-4, 4p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 124107271
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Characterization and reduction of capacitive loss induced by sub-micron Josephson junction fabrication in superconducting qubits.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Dunsworth%2C+A%2E%22">Dunsworth, A.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Megrant%2C+A%2E%22">Megrant, A.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Quintana%2C+C%2E%22">Quintana, C.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Zijun+Chen%22">Zijun Chen</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Barends%2C+R%2E%22">Barends, R.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Burkett%2C+B%2E%22">Burkett, B.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Foxen%2C+B%2E%22">Foxen, B.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Yu+Chen%22">Yu Chen</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Chiaro%2C+B%2E%22">Chiaro, B.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Fowler%2C+A%2E%22">Fowler, A.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Graff%2C+R%2E%22">Graff, R.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Jeffrey%2C+E%2E%22">Jeffrey, E.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Kelly%2C+J%2E%22">Kelly, J.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Lucero%2C+E%2E%22">Lucero, E.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Mutus%2C+J%2E+Y%2E%22">Mutus, J. Y.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Neeley%2C+M%2E%22">Neeley, M.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Neill%2C+C%2E%22">Neill, C.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Roushan%2C+P%2E%22">Roushan, P.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Sank%2C+D%2E%22">Sank, D.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Vainsencher%2C+A%2E%22">Vainsencher, A.</searchLink><relatesTo>2</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Applied+Physics+Letters%22">Applied Physics Letters</searchLink>; 7/10/2017, Vol. 111 Issue 2, p1-4, 4p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=124107271
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1063/1.4993577
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 4
        StartPage: 1
    Titles:
      – TitleFull: Characterization and reduction of capacitive loss induced by sub-micron Josephson junction fabrication in superconducting qubits.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Dunsworth, A.
      – PersonEntity:
          Name:
            NameFull: Megrant, A.
      – PersonEntity:
          Name:
            NameFull: Quintana, C.
      – PersonEntity:
          Name:
            NameFull: Zijun Chen
      – PersonEntity:
          Name:
            NameFull: Barends, R.
      – PersonEntity:
          Name:
            NameFull: Burkett, B.
      – PersonEntity:
          Name:
            NameFull: Foxen, B.
      – PersonEntity:
          Name:
            NameFull: Yu Chen
      – PersonEntity:
          Name:
            NameFull: Chiaro, B.
      – PersonEntity:
          Name:
            NameFull: Fowler, A.
      – PersonEntity:
          Name:
            NameFull: Graff, R.
      – PersonEntity:
          Name:
            NameFull: Jeffrey, E.
      – PersonEntity:
          Name:
            NameFull: Kelly, J.
      – PersonEntity:
          Name:
            NameFull: Lucero, E.
      – PersonEntity:
          Name:
            NameFull: Mutus, J. Y.
      – PersonEntity:
          Name:
            NameFull: Neeley, M.
      – PersonEntity:
          Name:
            NameFull: Neill, C.
      – PersonEntity:
          Name:
            NameFull: Roushan, P.
      – PersonEntity:
          Name:
            NameFull: Sank, D.
      – PersonEntity:
          Name:
            NameFull: Vainsencher, A.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 10
              M: 07
              Text: 7/10/2017
              Type: published
              Y: 2017
          Identifiers:
            – Type: issn-print
              Value: 00036951
          Numbering:
            – Type: volume
              Value: 111
            – Type: issue
              Value: 2
          Titles:
            – TitleFull: Applied Physics Letters
              Type: main
ResultId 1