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Guest Editorial Special Section on the IEEE International Conference on Microelectronic Test Structures.

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Bibliographic Details
Title: Guest Editorial Special Section on the IEEE International Conference on Microelectronic Test Structures.
Authors: Mita, Yoshio1, Smith, Stewart2
Source: IEEE Transactions on Semiconductor Manufacturing; Aug2017, Vol. 30 Issue 3, p190-191, 2p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 124503417
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Guest Editorial Special Section on the IEEE International Conference on Microelectronic Test Structures.
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=124503417
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/TSM.2017.2728938
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      – Code: eng
        Text: English
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        PageCount: 2
        StartPage: 190
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      – TitleFull: Guest Editorial Special Section on the IEEE International Conference on Microelectronic Test Structures.
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          Name:
            NameFull: Mita, Yoshio
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            NameFull: Smith, Stewart
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              M: 08
              Text: Aug2017
              Type: published
              Y: 2017
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              Value: 30
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