Reliability and failure analysis of solder joints in flip chip LEDs via thermal impedance characterisation.

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Title: Reliability and failure analysis of solder joints in flip chip LEDs via thermal impedance characterisation.
Authors: Magnien, J.1, julien.magnien@mcl.at, Mitterhuber, L.1, Rosc, J.1, Schrank, F.2, Hörth, S.3, Goullon, L.4, Hutter, M.4, Defregger, S.1, Kraker, E.1
Source: Microelectronics Reliability; Sep2017, Vol. 76, p601-605, 5p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 125255532
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Reliability and failure analysis of solder joints in flip chip LEDs via thermal impedance characterisation.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Magnien%2C+J%2E%22">Magnien, J.</searchLink><relatesTo>1</relatesTo>, <i>julien.magnien@mcl.at</i><br /><searchLink fieldCode="AU" term="%22Mitterhuber%2C+L%2E%22">Mitterhuber, L.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Rosc%2C+J%2E%22">Rosc, J.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Schrank%2C+F%2E%22">Schrank, F.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Hörth%2C+S%2E%22">Hörth, S.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Goullon%2C+L%2E%22">Goullon, L.</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AU" term="%22Hutter%2C+M%2E%22">Hutter, M.</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AU" term="%22Defregger%2C+S%2E%22">Defregger, S.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Kraker%2C+E%2E%22">Kraker, E.</searchLink><relatesTo>1</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Microelectronics+Reliability%22">Microelectronics Reliability</searchLink>; Sep2017, Vol. 76, p601-605, 5p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=125255532
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1016/j.microrel.2017.07.052
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 5
        StartPage: 601
    Titles:
      – TitleFull: Reliability and failure analysis of solder joints in flip chip LEDs via thermal impedance characterisation.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Magnien, J.
      – PersonEntity:
          Name:
            NameFull: Mitterhuber, L.
      – PersonEntity:
          Name:
            NameFull: Rosc, J.
      – PersonEntity:
          Name:
            NameFull: Schrank, F.
      – PersonEntity:
          Name:
            NameFull: Hörth, S.
      – PersonEntity:
          Name:
            NameFull: Goullon, L.
      – PersonEntity:
          Name:
            NameFull: Hutter, M.
      – PersonEntity:
          Name:
            NameFull: Defregger, S.
      – PersonEntity:
          Name:
            NameFull: Kraker, E.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 09
              Text: Sep2017
              Type: published
              Y: 2017
          Identifiers:
            – Type: issn-print
              Value: 00262714
          Numbering:
            – Type: volume
              Value: 76
          Titles:
            – TitleFull: Microelectronics Reliability
              Type: main
ResultId 1